首页> 外文OA文献 >Defect Analysis of High Electron Mobility Transistors Using a Scanning Electron and Laser Beams Induced Current (SELBIC) System

【2h】

Defect Analysis of High Electron Mobility Transistors Using a Scanning Electron and Laser Beams Induced Current (SELBIC) System

机译：使用扫描电子和激光束引起电流（SELBIC）系统的高电子迁移率晶体管的缺陷分析

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Haruki Sueyoshi; Shin-ichi Takasu; Woon Choi; Hajime Tomokage;
展开▼
作者单位

展开▼
年度 2008
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Scanning electron and laser beams induced current (SELBIC) method for observing failures in GaAs high electron mobility transistors [J] . Haruki Sueyoshi, Shin-ichi Takasu, Woon Choi, Superlattices and microstructures . 2009,第4a5期

机译：扫描电子和激光束感应电流（SELBIC）方法观察GaAs高电子迁移率晶体管中的故障
2. Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current [J] . C. L. Progl, C. M. Parish, J. P. Vitarelli, Applied Physicsletters . 2008,第24期

机译：扫描透射电子显微镜和电子束感应电流分析GaN基发光二极管中的V缺陷
3. Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current [J] . Meng L., Nagalingam D., Bhatia C.S., Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion . 2011,第9期

机译：用扫描电子声显微镜和电子束感应电流识别多晶硅太阳能电池的形貌和电缺陷
4. Physical failure analysis cases by Electron Beam Absorbed Current Electron Beam Induced Current detection on nano-probing SEM system [C] . Wen Pin Lin, Hsiu Ju Chang 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits . 2010

机译：纳米探测SEM系统上电子束吸收电流和电子束感应电流检测的物理故障分析案例
5. Characterization of nanocrystal-based photovoltaics: Electron microscopy & electron beam-induced current via scanning electron microscopy [D] . Ng, Amy. 2014

机译：纳米晶体光伏电池的表征：电子显微镜和通过扫描电子显微镜观察的电子束感应电流
6. Correlative analysis of immunoreactivity in confocal laser-scanning microscopy and scanning electron microscopy with focused ion beam milling [O] . Takahiro Sonomura, Takahiro Furuta, Ikuko Nakatani, 2013

机译：聚焦离子束铣削共聚焦激光扫描显微镜和扫描电子显微镜中免疫反应性的相关分析
7. Characterization of charged defects in Cd_xHg_(1-x)Te and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy [O] . Panin G. N., Diaz-Guerra C., Piqueras de Noriega Javier 1998

机译：电子束感应电流和扫描隧道光谱法表征Cd_xHg_（1-x）Te和CdTe晶体中的带电缺陷
8. SEM (Scanning Electron Microscope) Investigation of Silicon Diodes Using the Electron Beam Induced Current Method [R] . Snyder, M. E. 1984

机译：用电子束感应电流法研究硅二极管的sEm（扫描电子显微镜）

Defect Analysis of High Electron Mobility Transistors Using a Scanning Electron and Laser Beams Induced Current (SELBIC) System

著录项

引文网络

相似文献

相关主题

期刊订阅