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Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices

机译:表面层状态对光电和传感器设备材料强度的影响

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摘要

The goal of this work is to determine the correlation of the strength of brittleudamorphous nonmetallic materials with the defective surface layers and their physicaludproperties. The defective surface layer of materials for optoelectronic and sensors devicesudconsists of abundant structural near-surface defects, which are displaced under action ofudconstant load and thermal fluctuations, reducing the elasticity of the surface layer.udMicrocreep processes in tested materials can be described by a general equation that isudknown as the logarithmic microcreep equation. The applicability of this equation forudtested optical materials is indicative of the generality of microcreep processes inudcrystalline and amorphous hard materials. For each grade of polished optical glass, audminimal residual defective layer exists. The parameters of this layer are interrelated withudthe mechanical properties of glass, such as microhardness and optical strain coefficient,udand thermophysical properties, such as thermal diffusivity, sintering temperature, andudannealing temperature. The greater are the values of these properties, the less is theudconcentration of disrupted interatomic bonds. Based on the test results, the correspondingudequation, using the parameter E⋅a¹/², for determining the strength of optical silicate glassudand glassceramic has been proposed.
机译:这项工作的目的是确定脆性/非晶态非金属材料的强度与有缺陷的表面层及其物理/ ud性质之间的关系。光电和传感器设备材料的有缺陷表面层由大量结构近表面缺陷组成,这些缺陷在恒定载荷和热波动的作用下发生位移,从而降低了表面层的弹性。 ud受测材料中的微蠕变过程可以用一般的对数微蠕变方程描述。该方程对未测试的光学材料的适用性表明了在未结晶和非晶态硬质材料中微蠕变过程的普遍性。对于每个等级的抛光光学玻璃,存在一个最大的残留缺陷层。该层的参数与玻璃的机械性能(如显微硬度和光学应变系数),热物理性能(如热扩散率,烧结温度和退火温度)相关。这些性质的值越大,原子间键断裂的浓度越小。根据测试结果,提出了使用参数E⋅a1/2确定光学硅酸盐玻璃强度和玻璃陶瓷强度​​的相应公式。

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  • 作者

    Maslov V.P.;

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  • 年度 2008
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  • 原文格式 PDF
  • 正文语种 en
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