Laser scanning microscopy of HTS films and devices (Review Article)

摘要

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolvedudmethod of testing high–Tc materials and devices. The earlier results obtained by the authors areudbriefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTSudresponses in rf mode, probing the superconducting properties of HTS single crystals, developmentudof two-beam laser scanning microscopy. The existence of the phase slip lines mechanism ofudresistivity in HTS materials is proven by LSM imaging.