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ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric

机译：GaN-on-Si肖特基屏障二极管的开启状态可靠性：Si3N4与Al2O3 / SiO2获得电介质

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Eliana Acurio; Lionel Trojman; Brice de Jaeger; Benoit Bakeroot; Stefaan Decoutere;
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1. Formation of O‘—Sialon Matrix and Microstructure Development in the Refractory of Si3N4—SiO2—ZrO2—Al2O3 System [J] . KEChangming, SUNChengxu, 等中国耐火材料：英文版 . 1997,第003期
2. Reliability Assessment of AlGaN/GaN Schottky Barrier Diodes Under ON-State Stress [J] . Acurio Eliana, Trojman Lionel, Crupi Felice, IEEE transactions on device and materials reliability . 2020,第1期

机译：在国家压力下，Algan / GaN肖特基屏障二极管的可靠性评估
3. Reliability of Au-Free AlGaN/GaN-on-Silicon Schottky Barrier Diodes Under ON-State Stress [J] . Tallarico Andrea Natale, Stoffels Steve, Magnone Paolo, Electron Devices, IEEE Transactions on . 2016,第2期

机译：导通应力下无金的AlGaN /硅基GaN肖特基势垒二极管的可靠性
4. ON-State Degradation in AlGaN/GaN-on-Silicon Schottky Barrier Diodes: Investigation of the Geometry Dependence [J] . Andrea Natale Tallarico, Paolo Magnone, Steve Stoffels, IEEE Transactions on Electron Devices . 2016,第9期

机译：AlGaN /硅上的GaN肖特基势垒二极管的导通态降解：几何相关性的研究
5. ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric [C] . Eliana Acurio, Lionel Trojman, Brice de Jaeger, International Reliability Physics Symposium . 2021

机译：GaN-on-Si肖特基屏障二极管的持续状态可靠性：Si3n4与Al2O3 / SiO2获得电介质
6. SCHOTTKY BARRIER DIODES AND THEIR APPLICATION AS SCHOTTKY BARRIER RESISTORS [D] . HOGEBOOM, JOHN GORDON. 1973

机译：肖特基势垒二极管及其作为肖特基势垒电阻的应用
7. Frequency and gate voltage effects on the dielectric properties and electrical conductivity of Al∕SiO2∕p-Si metal-insulator-semiconductor Schottky diodes [O] . D. E. Yıldız, İ. Dökme -1

机译：频率和栅极电压对Al ∕ SiO2 ∕ p-Si金属-绝缘体-半导体肖特基二极管的介电性能和电导率的影响
8. Reliability of Au-Free AlGaN/GaN-on-Silicon Schottky Barrier Diodes Under ON-State Stress [O] . Tallarico Andrea, Stoffels Steve, Magnone Paolo, 2016

机译：导通应力下无金的AlGaN /硅基GaN肖特基势垒二极管的可靠性
9. Reliability Evaluation of Schottky Barrier Diode Microcircuits. [R] . lewis, e. t. bartels , d. 1976

机译：肖特基势垒二极管微电路的可靠性评估。

ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric

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