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A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes

机译：处于像差校正透射电子显微镜中分辨率分辨率的亚Ångstrom计量标准

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Michael A. OKeefe; Lawrence F. Allard;
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年度 2004
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1. Sub-?ngstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope [J] . Bell D.C., Russo C.J., Benner G. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2010,第4期

机译：单色，像差校正的透射电子显微镜的亚微微弱电压性能
2. Sub-?ngstrom electric field measurements on a universal detector in a scanning transmission electron microscope [J] . Miaofang?Chi, Juan?Carlos?Idrobo, Jordan?A.?Hachtel Advanced Structural and Chemical Imaging . 2018,第1期

机译：在扫描透射电子显微镜中的万能探测器上进行亚微秒级的电场测量
3. Restoring defect structures in 3C-SiC/Si (001) from spherical aberration-corrected high-resolution transmission electron microscope images by means of deconvolution processing [J] . Wen C., Wan W., Li F. H., Micron: The international research and review journal for microscopy . 2015,第Null期

机译：通过反卷积处理从球面像差校正的高分辨率透射电子显微镜图像中恢复3C-SiC / Si（001）中的缺陷结构
4. Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration-Corrected Scanning Transmission Electron Microscope with a Large Solid-Angle Detector [C] . M. Watanabe, A. Yasuhara, E. Okunishi Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting . 2012

机译：带有大立体角检测器的像差校正扫描透射电子显微镜中原子分辨率X射线图的定量分析
5. Three-dimensional imaging in an aberration-corrected scanning transmission electron microscope [D] . Xin, Huolin. 2011

机译：像差校正扫描透射电子显微镜中的三维成像
6. Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope [O] . Jordan A. Hachtel, Juan Carlos Idrobo, Miaofang Chi -1

机译：扫描透射电子显微镜中通用探测器的亚埃级电场测量
7. Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens [O] . Lawrence F. Allard, Michael A. OKeefe 2004

机译：使用A-OK标准测试标本的像差校正透射电子显微镜分辨率的亚Ångstrom测量

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes

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