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Comparative study of GeO2/Ge and SiO2/Si structures on anomalous charging of oxide films upon water adsorption revealed by ambient-pressure X-ray photoelectron spectroscopy

机译：Geo2 / Ge和SiO2 / Si结构对环境压力X射线光电子谱显示在水吸附时氧化膜异常充电的对比研究

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Daichi Mori; Hiroshi Oka; Takuji Hosoi; Kentaro Kawai; Mizuho Morita; Ethan J. Crumlin; Zhi Liu; Heiji Watanabe; Kenta Arima;
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1. Comparative study of GeO_2/Ge and SiO_2/Si structures on anomalous charging of oxide films upon water adsorption revealed by ambient-pressure X-ray photoelectron spectroscopy [J] . Daichi Mori, Hiroshi Oka, Takuji Hosoi, Journal of Applied Physics . 2016,第9期

机译：常压X射线光电子能谱法揭示水吸附后氧化膜异常带电的GeO_2 / Ge和SiO_2 / Si结构的比较研究
2. Water Adsorption, Solvation, and Deliquescence of Potassium Bromide Thin Films on SiO2 Studied by Ambient-Pressure X-ray Photoelectron Spectroscopy [J] . Kenta Arima, Peng Jiang, Xingyi Deng The journal of physical chemistry, C. Nanomaterials and interfaces . 2010,第35期

机译：环境压力X射线光电子能谱研究SiO2上溴化钾薄膜的水吸附，溶剂化和潮解
3. Water Adsorption, Solvation, and Deliquescence of Potassium Bromide Thin Films on SiO2 Studied by Ambient-Pressure X-ray Photoelectron Spectroscopy [J] . Kenta Arima, Peng Jiang, Xingyi Deng The journal of physical chemistry, C. Nanomaterials and interfaces . 2010,第35期

机译：环境压力X射线光电子能谱研究SiO2上溴化钾薄膜的水吸附，溶剂化和潮解
4. Electronic Structure of Pt and Pt-Co Nanoparticles with O_2 and O_2/H_2O Adsorption Revealed by In Situ XAFS and Hard X-ray Photoelectron Spectroscopy [C] . Yitao Cui, Yoshihisa Harada, Tatsuya Hatanaka, Symposium on joint general session: batteries and energy storage -and- fuel cells, electrolytes, and energy conversion;Meeting of The Electrochemical Society . 2016

机译：原位XAFS和硬X射线光电子能谱揭示具有O_2和O_2 / H_2O吸附的Pt和Pt-Co纳米粒子的电子结构
5. Growth and structure of ultra-thin epitaxial chromium and iron oxide films on silver(001) and silver(111): A comprehensive study accomplished by x-ray photoelectron diffraction and low energy electron diffraction. [D] . Ozturk, Osman. 2002

机译：银（001）和银（111）上超薄外延铬和氧化铁膜的生长和结构：通过X射线光电子衍射和低能电子衍射完成的综合研究。
6. Soft x-ray reflectometry hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks [O] . Elena O Filatova, Igor V Kozhevnikov, Andrey A Sokolov, 2012

机译：TiO2（Ti）/ SiO2 / Si叠层内部结构的软X射线反射法硬X射线光电子能谱和透射电子显微镜研究
7. Comparative Study of the Oxidation of NiAl(100) by Molecular Oxygen and Water Vapor Using Ambient-Pressure X-ray Photoelectron Spectroscopy [O] . Qianqian Liu, Hailang Qin, Jorge Anibal Boscoboinik, 2016

机译：使用环境压力X射线光电子谱分子氧气氧气和水蒸气对Nial（100）氧化的对比研究

Comparative study of GeO2/Ge and SiO2/Si structures on anomalous charging of oxide films upon water adsorption revealed by ambient-pressure X-ray photoelectron spectroscopy

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