首页> 外文OA文献 >Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

【2h】

Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

机译：多孔细粒材料的TEM样品综合离子束 - 超微传递方法

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Kenta K. Ohtaki; John P. Bradley; Hope A. Ishii;
展开▼
作者单位

展开▼
年度 2019
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Combined Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials [J] . Ohtaki Kenta K., Ishii Hope A., Bradley John P. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2020,第1期

机译：多孔细粒粒粒性粒子制剂的组合聚焦离子束 - 超微术法
2. Improved focused ion beam target preparation of (S)TEM specimen-a method for obtaining ultrathin lamellae [J] . Lechner L., Biskupek J., Kaiser U. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2012,第2期

机译：改进的聚焦离子束靶制备（S）TEM样品-获得超薄薄片的方法
3. 集束イオンビーム法によるTEM 試料作製とダメージ層除去TEM specimen preparation using focused ion beam and removal of the damaged layer [J] . 加藤丈晴, 佐々木宏和, 平山司材料とプロセス: 日本鉄鋼協会講演論文集 . 2009,第1期

机译：使用聚焦离子束制备TEM样品并去除受损层
4. Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials [C] . Jian-Guo Zheng, Sujing Xie International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting . 2011

机译：聚焦离子束在纳米TEM样品制备中的应用
5. Computational and experimental quantification of focused ion beam damage in silicon during TEM specimen preparation. [D] . Jamison, Robert Bruce. 2000

机译：TEM样品制备过程中硅中聚焦离子束损伤的计算和实验量化。
6. Influence of Specimen Preparation and Test Methods on the Flexural Strength Results of Monolithic Zirconia Materials [O] . Christine Schatz, Monika Strickstrock, Malgorzata Roos, 2016

机译：试样制备和测试方法对整体氧化锆材料抗弯强度结果的影响
7. Specimen Preparation Methods with FIB for In-Situ TEM Observations in Materials Science
^^mdash;TEM Specimen Preparation by FIB with Glass Manipulator^^mdash; [O] . Toshiaki Suzuki, Yoshimasa Takahashi 2012

机译：具有FIB的样品制备方法，用于材料科学的原位TEM观测
^ ^ MDASH; FIB用玻璃机械手^ ^ mdash制备TEM样本;
8. Preparation of TEM (Transmission Electron Microscope) Specimens from Hazardous or Difficult Materials [R] . Sklad, P. S. 1987

机译：从危险或困难材料制备TEm（透射电子显微镜）样品

Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

著录项

引文网络

相似文献

相关主题

期刊订阅