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A New Method for Atomic Depth Distribution Analysis Using RHEED-Total Reflection Angle X-ray Spectroscopy(TRAXS), and Growth Modes of Thin Films.

机译：一种新的原子深度分布分析方法，使用Rheed-总反射角X射线光谱（TraxS）和薄膜的生长模式。

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Toshiro YAMANAKA; Shozo INO;
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年度 1994
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1. Atomick layer epitaxy processes of ZnSe on GaAs(0 0 1) as observed by beam-rocking reflection hgih-energy electron diffraction (RHEED) anjd total-reflection-angle X-ray spectrosocpy (TRAXS) [J] . Akihiro Ohtake, Takashi Hanada, Kenta Arai Journal of Crystal Growth . 1999,第MAY期

机译：束流反射高能电子衍射（RHEED）和全反射角X射线光谱（TRAXS）观察到的GaAs（0 0 1）上ZnSe的原子层外延过程
2. Depth profiling analysis of HfON on SiON ultrathin films by parallel angle resolved x-ray photoelectron spectroscopy and medium energy ion scattering [J] . Fauquier Laurent, Pelissier Bernard, Jalabert Denis, Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2016,第7期

机译：平行角分辨X射线光电子能谱和中能离子散射对HON在SiON超薄膜上的深度分布分析
3. Structural analyses of sphere- and cylinder-forming triblock copolymer thin films near the free surface by atomic force microscopy, X-ray photoelectron spectroscopy, and grazing-incidence small-angle X-ray scattering [J] . Rasha Ahmed Hanafy Bayomi, Takashi Aoki, Takuma Shimojima, Polymer: The International Journal for the Science and Technology of Polymers . 2018,第期

机译：通过原子力显微镜，X射线光电子体光谱，X射线光电子体光谱和放牧发生小角X射线散射的球形和圆柱形三嵌段共聚物薄膜的结构分析
4. Depth-Resolved Composition and Chemistry of Ultra-Thin Films by Angle-Resolved X-Ray Photoelectron Spectroscopy [C] . C. R. Brundle, G. Conti, H. Graoui, International Conference on Characterization and Metrology for ULSI Technology . 2005

机译：通过角度分辨的X射线光电子光谱分析超薄膜的深度分辨的组合物和化学
5. X-ray Photoelectron Spectroscopy Studies of Solute Depth Distributions at the Liquid/Vapor Interface of Aqueous Solutions and Surface Structure of Pyrite Thin Films. [D] . Cheng, Ming Hsin. 2011

机译：X射线光电子能谱研究水溶液/液界面的溶质深度分布和黄铁矿薄膜的表面结构。
6. X-ray fluorescence analysis of metal distributions in cryogenic biological samples using large-acceptance-angle SDD detection and continuous scanning at the Hard X-ray Micro/Nano-Probe beamline P06 at PETRA III [O] . C. Rumancev, A. Gräfenstein, T. Vöpel, -1

机译：使用大接受角SDD检测并在PETRA III的硬X射线Micro / Nano-Probe光束线P06上连续扫描对低温生物样品中的金属分布进行X射线荧光分析
7. Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy). [O] . Shozo INO 1995

机译：RAWEED（反射高能电子衍射）-Traxs（总反射角X射线光谱）外延的研究。

A New Method for Atomic Depth Distribution Analysis Using RHEED-Total Reflection Angle X-ray Spectroscopy(TRAXS), and Growth Modes of Thin Films.

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