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Magnetotransport properties of AlxGa1−xN∕AlN∕GaN heterostructures grown on epitaxial lateral overgrown GaN templates

机译:在外延横向覆盖GaN模板上生长的Alxga1-XN / ALN / ALN / ALN / GAN异质结构的MagnetOransport属性

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摘要

We studied the low-temperature magnetotransport properties of AlxGa1−xN∕AlN∕GaN heterostructures with a two-dimensional electron gas(2DEG). Structures with different Al compositions were grown by metal-organic vapor-phase epitaxy on three types of templates: conventional undoped GaN, in situ epitaxial lateral overgrown GaN using a SiNx nanomask layer, and ex situe pitaxial lateral overgrown GaN (ELO-GaN) using a stripe-patterned SiO2 mask. All of the samples display Shubnikov–de Haas (SdH) oscillations that confirm the existence of 2DEGs. Field-dependent magnetoresistance and Hall measurements further indicate that the overgrown heterostructures have a parallel conducting layer in addition to the 2DEG. To characterize the parallel channel, we repeated the measurements after the 2DEG was etched away. 2DEGcarrier density values were then extracted from the SdH data, whereas the zero-field 2DEG conductivity was determined by subtracting the parallel channel conductivity from the total. The quantitative mobility spectrum analysis could not be applied in some cases, due to a large contact resistance between the parallel channels. The resulting 2DEG mobility is about a factor of 2 higher in the ELO-GaN and SiN–GaN samples as compared to the standard control samples. The mobility enhancement is attributed to a reduction of threading dislocations by the two ELO techniques employed.
机译:我们研究了带有二维电子气(2DEG)的AlxGa1-xN ∕ AlN ∕ GaN异质结构的低温磁传输性质。通过金属有机气相外延在三种类型的模板上生长具有不同Al组成的结构:常规的未掺杂GaN,使用SiNx纳米掩模层的原位外延横向过生长的GaN和使用以下方法进行的外延性横向过生长的GaN(ELO-GaN)条纹图案的SiO2掩模。所有样本均显示了Shubnikov-de Haas(SdH)振荡,证实了2DEG的存在。与场有关的磁阻和霍尔测量进一步表明,长满的异质结构除2DEG外还具有平行的导电层。为了表征并行通道,我们在蚀刻掉2DEG之后重复了测量。然后从SdH数据中提取2DEG载流子密度值,而零场2DEG电导率通过从总数中减去平行通道电导率来确定。由于平行通道之间的接触电阻较大,因此在某些情况下无法应用定量迁移谱分析。与标准对照样品相比,ELO-GaN和SiN-GaN样品中产生的2DEG迁移率大约高2倍。迁移率的提高归因于所采用的两种ELO技术减少了线程错位。

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