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Radiation Detection Properties of 4H-SiC Schottky Diodes Irradiated Up to$10^16$n/cm$^2$by 1 MeV Neutrons

机译:4H-SiC肖特基二极管的辐射检测特性辐照高达10美元$ N / cm $ ^ 2 $ 1 MEV中子

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摘要

We report the results of an experimental study on the radiation hardness of 4H-SiC diodes used as alpha-particle detectors with 1 MeV neutrons up to a fluence of 8 x 10(15) n/cm(2). As the irradiation level approaches the range 10(15) n/cm(2), the material behaves as intrinsic due to a very high compensation effect and the diodes are still able to detect with a reasonable good Charge Collection Efficiency (CCE = 80%).For fluences > 10(15) n/cm(2) CCE decreases monotonically to approximate to 20 % at the highest fluence. Heavily irradiated SiC diodes have been studied, by means of Photo Induced Current Transient
机译:我们报告了用作α-粒子探测器的4H-SiC二极管的辐射硬度的实验研究结果,其具有1meV中子的流量为8×10(15)n / cm(2)。当照射水平接近范围10(15)n / cm(2)时,由于非常高的补偿效果,该材料表现为本质,并且二极管仍然能够以合理的良好充电收集效率检测(CCE = 80% )。流量> 10(15)n / cm(2)CCE单调减少,以最高流量的约20%。通过照片诱导电流瞬态研究了大量辐照的SiC二极管

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