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Subgrain size-distributions, dislocation structures, stacking- and twin faults and vacancy concentrations in crystalline materials determined by X-ray line profile analysis

机译：X射线线轮廓分析确定的晶粒尺寸分布，位错结构，堆叠结构，堆叠和双故障和空位浓度

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T. Ungár;
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1. 冷加工变形Pb-Ca-Sn合金位错类型、密度和晶粒尺寸分布的X射线衍射峰形分析 [J] . F.ABOUHILOU, A.KHEREDDINE, B.ALILI, 中国有色金属学报（英文版） . 2012,第003期
2. 冷加工变形Pb-Ca-Sn合金位错类型、密度和晶粒尺寸分布的X射线衍射峰形分析（英文） [J] . F.ABOUHILOU, A.KHEREDDINE, B.ALILI, 中国有色金属学报：英文版 . 2012,第003期
3. A new procedure of X-ray line profile analysis applied to study the dislocation structure and subgrain size-distributions in fatigued MANET steel [J] . Ungar T., Marmy P., Hanak P., Journal of Nuclear Materials: Materials Aspects of Fission and Fusion . 2000,第0期

机译：X射线线轮廓分析的新方法用于研究疲劳MANET钢的位错结构和亚晶粒尺寸分布
4. Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis [J] . T.Ungar, S.Ott, P.G.Sanders Acta Materialia . 1998,第10期

机译：高分辨率X射线衍射和峰轮廓分析的新方法确定纳米结构铜中的位错，晶粒尺寸和平面缺陷
5. The dislocation density and twin-boundary frequency determined by X-ray peak profile analysis in cold rolled magnetron-sputter deposited nanotwinned copper [J] . Gabor Csiszar, Levente Balogh, Amit Misra, Journal of Applied Physics . 2011,第4期

机译：X射线峰轮廓分析确定的冷轧磁控溅射沉积纳米孪晶铜的位错密度和双边界频率
6. Subgrain Size-Distributions, Dislocation Structures, Stacking- and Twin Faults and Vacancy Concentrations in SPD Materials Determined by X-ray Line Profile Analysis [C] . T. Ungar International Conference on Nanomaterials by Severe Plastic Deformation(NanoSPD3) . 2006

机译：由X射线线轮廓分析确定的SPD材料中的粒度大小分布，位错结构，堆叠和双故障和空位浓度
7. Simulating Irradiation-Induced Dislocation Loops in Zirconium Alloys: Understanding Their Structure, Formation and Effect on X-ray Diffraction Line Profiles [D] . Hulse, Rory. 2019

机译：模拟锆合金中的辐照引起的位错环：了解其结构，形成以及对X射线衍射线轮廓的影响
8. Profile structures of the voltage-sensor domain and the voltage-gated K+-channel vectorially oriented in a single phospholipid bilayer membrane at the solid-vapor and solid-liquid interfaces determined by x-ray interferometry [O] . S. Gupta, J. Liu, J. Strzalka, -1

机译：电压传感器域的轮廓结构和电压门控钾+通道在固体 - 蒸气和固体 - 液体界面的单个磷脂双层膜定向矢量由下式确定的X射线干涉测量
9. Densities and character of dislocations and size-distribution of subgrains in deformed metals by X-ray diffraction profile analysis [O] . T. Ungár A, J. Gubicza A, P. Hanák A, 2015

机译：通过X射线衍射分析分析，变形金属中亚晶的位错和尺寸分布的密度和特征
10. Characterization of the Microstructure in Crystalline Materials Using Diffraction Line Profile Analysis. [R] . B. Levente 2011

机译：用衍射线轮廓分析表征结晶材料的微观结构。

Subgrain size-distributions, dislocation structures, stacking- and twin faults and vacancy concentrations in crystalline materials determined by X-ray line profile analysis

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