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Fabrication and characterization of room temperature operating single electron transistors using focused ion beam technologies

机译：使用聚焦离子束技术的室温制造和表征单电子晶体管

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Prasanjit Santosh Karre;
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1. Fabrication Technique for Carbon Nanotube Single-Electron Transistors Using Focused Ion Beam [J] . Yuto KUROKAWA, Yutaka OHNO, Shigeru KISHIMOTO, Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes . 2004,第8A期

机译：聚焦离子束制备碳纳米管单电子晶体管的技术
2. Room temperature operational single electron transistor fabricated by focused ion beam deposition [J] . P. Santosh Kumar Karre, Paul L. Bergstrom, Govind Mallick, Journal of Applied Physics . 2007,第2期

机译：通过聚焦离子束沉积制备的室温工作单电子晶体管
3. Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor [J] . Chan Kyeong HYON, Atsuhiko KOJIMA, Takafumi KAM1MURA, Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes . 2005,第4A期

机译：碳纳米管的非接触原子力显微镜电操纵及其在室温工作单电子晶体管制造中的应用
4. Focused Ion Beam Fabrication of Sub-20nm Inter-electrode Gaps for Room Temperature Operating Single Electron Transistor [C] . Manoranjan Acharya, P. Santosh Kumar Karre, Paul L. Bergstrom IEEE Conference on Nanotechnology . 2008

机译：用于室温的聚焦离子束制造室温度操作单电子晶体管的电极电极间隙
5. Fabrication and characterization of room temperature operating single electron transistors using focused ion beam technologies. [D] . Karre, Prasanjit Santosh Kumar. 2008

机译：使用聚焦离子束技术的室温工作单电子晶体管的制造和表征。
6. Nanoelectromechanical device fabrications by 3-D nanotechnology using focused-ion beams [O] . Reo Kometani, Sunao Ishihara 2009

机译：使用聚焦离子束的3-D纳米技术制造纳米机电装置
7. Fabrication Technology of the Focusing Grating Coupler using Single-step Electron Beam Lithography [O] . 2002

机译：采用单步电子束光刻的聚焦光栅耦合器的制造技术
8. Effect of Tunnel Resistance in the Strong Tunneling Regime on the Conductance of the Single Electron Transistors Fabricated Using Focused Ion Beam Etching; Conference paper [R] . Karre, P. S., Bergstrom, P. L., Mallick, G., 2006

机译：强隧道内隧道阻力对聚焦离子束刻蚀制备单电子晶体管电导的影响2。会议文件

Fabrication and characterization of room temperature operating single electron transistors using focused ion beam technologies

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