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Conducting Probe Atomic Force Microscopy Investigation of Anisotropic Charge Transport in Solution Cast PBD Single Crystals Induced by an External Field

机译：探针原子力显微镜显微镜调查外场溶液浇注PBD单晶的各向异性电荷输送

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1. Conducting Probe Atomic Force Microscopy Investigation of Anisotropic Charge Transport in Solution Cast PBD Single Crystals Induced by an External Field [J] . Minlu Zhang, Zhijun Hu, Tianbai He The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 2004,第50期

机译：导电探针原子力显微镜研究外场诱导的溶液浇铸PBD单晶中各向异性电荷传输
2. Investigation of Charge Transport in Thin, Doped Sexithiophene Crystals by Conducting Probe Atomic Force Microscopy [J] . Michael J. Loiacono, Eric L. Granstrom, C. Daniel Frisbie The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 1998,第10期

机译：探针原子力显微镜研究掺杂的六噻吩薄膜中的电荷传输
3. Investigation of Charge Transport in Thin, Doped Sexithiophene Crystals by Conducting Probe Atomic Force Microscopy [J] . Michael J. Loiacono, Eric L. Granstrom, C. Daniel Frisbie The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 1998,第9a12期

机译：探针原子力显微镜研究掺杂的六噻吩薄膜中的电荷传输
4. Use of atomic force microscopy to probe surface charge densities in electrolyte solutions on a nanometer scale [C] . Raiteri, R., Martinoia, . 1997

机译：使用原子力显微镜以纳米级探测电解质溶液中的表面电荷密度
5. Charge transport and contact effects in nanoscopic conjugated molecular junctions characterized by conducting probe atomic force microscopy. [D] . Kim, Bong Soo. 2008

机译：纳米共轭分子结中的电荷传输和接触效应，其特征在于进行探针原子力显微镜观察。
6. Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [O] . Yann Almadori, David Moerman, Jaume Llacer Martinez, 2018

机译：有机铅三溴化物钙钛矿单晶的多峰非接触原子力显微镜和开尔文探针力显微镜研究
7. Charge Transport in Metal-Molecule-Metal Junctions Probed by Conducting Atomic Force Microscopy [O] . Min Hyung Lee, Hyunwook Song 2013

机译：通过导电原子力显微镜探测的金属分子 - 金属结的电荷传输
8. Charging of single Si nanocrystals by atomic force microscopy [R] . Bell, L. D., Boer, E., Brongersma, M. L., 2001

机译：通过原子力显微镜对单个si纳米晶体进行充电

Conducting Probe Atomic Force Microscopy Investigation of Anisotropic Charge Transport in Solution Cast PBD Single Crystals Induced by an External Field

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