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The Mechanism and Diagnosis of Insulation Deterioration Caused by Moisture Ingress into Oil-Impregnated Paper Bushing

机译:水分进入对油浸纸衬套引起的绝缘劣化的机制及诊断

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摘要

The healthy state of insulation in oil-impregnated bushings is traditionally evaluated by tanδ and capacitance at power frequency and mostly at 10 kV in the test standard. However, there has frequently been insulation accidents induced by moisture ingress (MI) for bushings that have passed the standard. The mechanism and new diagnostic features for MI into bushings were not distinct enough and an accurate test method is urgently needed research. To address this technical gap, a bushing model with a transparent sheath was designed and an ultrasonic humidifier device was adopted to simulate the environment of MI in bushings and recorded by digital camera. The parameters of dielectric dissipation factor, capacitance, partial discharge (PD), frequency domain response, and moisture content in oil were measured at room temperature with time. The results presented that both the increment dissipation factor at low frequency of 0.001 Hz and the increment dissipation factor of 1.2 Um could be used for detecting the earlier insulation defect of oil-impregnated paper (OIP) bushings. The phase resolved partial discharge (PRPD) can serve as the diagnostic basis of the severe state (S3) of insulation deterioration caused by MI into bushings around the phases of 0–117°, 151–303°, and 325–360°. The research findings would provide a useful reference for the condition diagnosis and maintenance of OIP bushings. Especially, the increment detection of Frequency Domain Spectroscopy (FDS) at the frequency of 1 mHz and 10 kHz was recommended firstly for the operative bushings in real sites.
机译:在传统上通过Tanδ和功率频率的电容来评估油浸衬套中的健康状态,并且在测试标准中大多数是10kV的电容。然而,对于已经通过该标准的衬套,经常是由水分入口(MI)引起的绝缘事故。 MI的机制和新诊断特征进入衬套并不差异,迫切需要准确的测试方法。为了解决这一技术差距,设计了具有透明护套的衬套模型,采用超声波加湿器装置来模拟衬套中MI的环境,并通过数码相机录制。在室温下,在室温下测量介电耗散因子,电容,局部放电(Pd),频域响应和水分含量的参数。结果表明,低频频率为0.001Hz的增量耗散因数和1.2μm的增量耗散因子可用于检测溢油纸(OIP)衬套的早期绝缘缺陷。相位分辨的局部放电(PRPD)可以用作由MI围绕0-117°,151-303°和325-360°围绕围绕的Mi引起的绝缘劣化的严重状态(S3)的诊断基础。研究结果将为OIP衬套的条件诊断和维护提供有用的参考。特别是,建议在实际场地中的操作衬套的频率为1MHz和10kHz频率下频域光谱(FDS)的增量检测。

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