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Determining alignment in measurement of a large-diameter thread by means of devices for profile measurement

机译：通过用于轮廓测量的装置确定大直径线程测量的对准

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S. V. Kosarevsky;
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年度 2009
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1. DETERMINING ALIGNMENT IN MEASUREMENT OF A LARGE-DIAMETER THREAD BY MEANS OF DEVICES FOR PROFILE MEASUREMENT [J] . S. V. Kosarevskii Measurement techniques . 2008,第12期

机译：用轮廓测量装置测量大螺纹螺纹的对准度
2. Determining GaInP/GaAs HBT Device Structure by DC Measurements on a Two-Emitter HBT Device and High Frequency Transit Time Measurements [J] . Chinchun MENG, Bo-Chen TSOU, Sheng-Che TSENG IEICE Transactions on Electronics . 2005,第6期

机译：通过两发射器HBT器件的直流测量和高频传输时间测量来确定GaInP / GaAs HBT器件结构
3. Spatial and energetical profiles of defects extracted from ultra-low level trap-assisted leakage current in non-volatile floating thin tunnel oxide memory devices by using direct and floating gate technique measurements [J] . Burignat S, Plossu C, Boivin P Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites . 2007,第16a17期

机译：通过直接和浮栅技术测量从非易失性浮动薄隧道氧化物存储器件中的超低水平陷阱辅助泄漏电流提取的缺陷的空间和能量分布
4. A new approach to determine active doping profiles of bipolar transistors using electrical measurements and a physical device simulator [C] . Hachicha, I., Fouillat, . 1996

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5. Simultaneous Measurement of Electromechanical Coupling and Conductance to Determine the Binding Configuration of Single-molecule Devices [D] . Ramachandran, Roohi. 2018

机译：同时测量机电耦合和电导以确定单分子器件的结合构型
6. Integrated Flexible Electronic Devices Based on Passive Alignment for Physiological Measurement [O] . Jin Hwa Ryu, Sangwon Byun, In-Bok Baek, 2017

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7. Analysis of the inverse problem for determining nematic liquid crystal director profiles from optical measurements using singular value decomposition. [O] . Lionheart, WRB, Newton, CJP 2006

机译：确定反问题的分析向列液晶指向矢光学使用奇异值分解进行测量。
8. CAPACITANCE-VOLTAGE MEASUREMENTS FOR DETERMINING IMPURITY PROFILES IN SEMICONDUCTORS [R] . B. J. SMITH 1972

机译：用于确定半导体中杂质分布的电容 - 电压测量

Determining alignment in measurement of a large-diameter thread by means of devices for profile measurement

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