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Surface Chemical Structural Analysis of Diamond-like Carbon Films by X-ray Photoelectron Spectroscopy

机译：X射线光电子能谱表面化学结构分析

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Susumu Takabayashi; Takayuki Takahagi;
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1. X-ray photoelectron analysis of surface functional groups on diamond-like carbon films by gas-phase chemical derivatization method [J] . Susumu Takabayashi, Keishi Okamoto, Hiroaki Motoyama, Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2010,第2期

机译：气相化学衍生法分析类金刚石碳膜表面官能团的X射线光电子
2. Chemical Structural Analysis of Diamondlike Carbon Films with Different Electrical Resistivities by X-ray Photoelectron Spectroscopy [J] . Susumu Takabayashi, Keishi Okamoto, Kenya Shimada, Japanese journal of applied physics . 2008,第5issue1期

机译：用X射线光电子能谱分析不同电阻率的类金刚石碳膜的化学结构
3. Surface oxidation process of a diamond-like carbon film analyzed by difference X-ray photoelectron spectroscopy [J] . Takabayashi Susumu, Takahagi Takayuki Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2015,第3期

机译：差示X射线光电子能谱分析类金刚石碳膜的表面氧化过程
4. Critical thickness of diamond-like carbon study using X-ray photoelectron spectroscopy depth profiling [C] . Khamnaulthong Nattaporn, Siangchaew Krisda, Limsuwan Pichet 2013 IEEE 5th International Nanoelectronics Conference. . 2013

机译：使用X射线光电子能谱深度分析研究类金刚石碳的临界厚度
5. An in situ x-ray photoelectron spectroscopy analysis of thin films created through physical vapor deposition of aluminum and plasma enhanced chemical vapor deposition of trimethylsilane. [D] . Scott, Paul Robert, Jr. 2007

机译：通过铝的物理气相沉积和等离子体增强的三甲基硅烷化学气相沉积产生的薄膜的原位X射线光电子能谱分析。
6. Detecting Carbon in Carbon: Exploiting Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy [O] . Justin M. Gorham, William A. Osborn, Jeremiah W. Woodcock, -1

机译：检测碳中的碳：利用差分充电通过X射线光电子能谱获得复合材料中碳纳米管聚集体的化学识别和空间位置信息
7. Analysis of the Carbon Film on the Ibushi-Kawara in Sanshu Used by X-ray Photoelectron Spectroscopy, Raman Spectroscopy and X-ray Absorption Spectroscopy. [O] . Osamu Fukuoka, Takanori Sugimoto, Toshiaki Nakao, 2018

机译：X射线光电子体光谱，拉曼光谱和X射线吸收光谱法分析Sanshu中的Sanshu碳膜。
8. X-Ray Photoelectron Spectroscopy of Metal, Metal Oxide, and Carbon Electrode Surfaces Chemically Modified with Ferrocene and Ferricenium [R] . Umana, M., Rolison, D. R., Nowak, R., 1980

机译：用二茂铁和二茂铁化学改性的金属，金属氧化物和碳电极表面的X射线光电子能谱

Surface Chemical Structural Analysis of Diamond-like Carbon Films by X-ray Photoelectron Spectroscopy

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