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Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

机译：通过导电探针原子力显微镜和拉曼成像直接观察外延金刚石肖特基屏障装置的漏电流

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J Alvarez; M Boutchich; J P Kleider; T Teraji; Y Koide;
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1. Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging [J] . J Alvarez, M Boutchich, J P Kleider, Journal of Physics, D. Applied Physics: A Europhysics Journal . 2014,第35期

机译：通过导电探针原子力显微镜和拉曼成像直接观察外延金刚石肖特基势垒器件中的泄漏电流
2. Surface Morphology of Leakage Current Source of 4H-SiC Schottky Barrier Diode by Atomic Force Microscopy [J] . T. Katsuno, Y. Watanabe, T. Ishikawa, Materials science forum . 2012,第PTa1期

机译：原子力显微镜研究4H-SiC肖特基势垒二极管漏电流源的表面形貌
3. Direct observation/characterization of spatial distribution of current leakage spots in zinc oxide/aluminum nitride thin film precursor field effect transistor structures using conducting atomic force microscopy [J] . Shirshendu Dey, Suhas M. Jejurikar, K. P. Adhi, Applied Physicsletters . 2008,第9期

机译：使用导电原子力显微镜直接观察/表征氧化锌/氮化铝薄膜前体场效应晶体管结构中电流泄漏点的空间分布
4. Surface Morphology of Leakage Current Source of 4H-SiC Schottky Barrier Diode by Atomic Force Microscopy [C] . T. Katsuno, Y. Watanabe, T. Ishikawa, ICSCRM 2011;International conference on silicon carbide and related materials . 2012

机译：原子力显微镜研究4H-SiC肖特基势垒二极管漏电流源的表面形貌
5. Integration of electrochemical methods with surface enhanced Raman spectroscopy, scanning tunneling microscopy, and atomic force microscopy. [D] . Nicholson, Marjorie Anne. 2001

机译：电化学方法与表面增强拉曼光谱，扫描隧道显微镜和原子力显微镜的集成。
6. The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy [O] . Shujie Wang, Gang Cheng, Ke Cheng, 2011

机译：导电原子力显微镜研究单个SnO2纳米带纳米器件的当前图像
7. Two Dimensional Imaging of the Laterally Inhomogeneous Au/4H-SiC Schottky Barrier by Conductive Atomic Force Microscopy [O] . F. Giannazzo, F. Roccaforte, S. F. Liotta, 2016

机译：导电原子力显微镜对横向非均匀au / 4H-siC肖特基势垒的二维成像
8. Observation of Localized Corrosion of Ni-Based Alloys Using Coupled Orientation Imaging Microscopy and Atomic Force Microscopy. [R] . Bedrossian, P. J., Schwartz, A. J., Kumar, M., 1999

机译：用耦合取向显微镜和原子力显微镜观察镍基合金的局部腐蚀。

Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

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