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Recurrence Formulae for the Reflectance And Transmittance of Multilayer Films with Applications

机译：具有应用的多层膜的反射率和透射率的复发公式

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GH Godfrey;
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年度 1957
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1. Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements [J] . Chubing Peng, Rongguang Liang, J. Kevin Erwin, Applied optics . 2001,第28期

机译：通过同时进行反射率，透射率和椭偏测量来确定薄膜和多层堆叠的光学常数
2. Reflectance modulation of transparent multilayer thin films for energy efficient window applications [J] . Koohee Han, Jung Hyeun Kim Materials Letters . 2011,第15a16期

机译：用于节能窗户应用的透明多层薄膜的反射率调制
3. Toward maximum transmittance into absorption layers in solar cells: investigation of lossy-film-induced mismatches between reflectance and transmittance extrema [J] . Yin-Jung Chang, Chi-Sheng Lai Optics Letters . 2013,第17期

机译：争取最大透射率进入太阳能电池的吸收层：有损耗膜引起的反射率和透射率极值之间的不匹配研究
4. Linear optical constants of ultrathin copperphthalocyanine films from transmittance and reflectance data: error function minimization when the film thickness is below 20 nm [C] . Author(s): Olaf Stenzel Chemnitz-Zwickau Univ. of Technology Chemnitz Federal Republic of Germany, Ralf Petrich Chemnitz-Zwickau Univ. of Technology Chemnitz Federal Republic of Germany, Steffen Wilbrandt Chemnitz-Zwickau Univ. of Technology Chemnitz Federal Republic of Germany, Growth and Characterization of Materials for Infrared Detectors II . 1995

机译：从透射率和反射率数据看超薄铜酞菁薄膜的线性光学常数：当薄膜厚度低于20 nm时，误差函数最小化
5. Layer-by-Layer Fabrication of Porphyrin Multilayer Films via Copper(I)-Catalyzed Azide-Alkyne Cycloaddition: Film Properties and Applications in Dye-Sensitized Solar Cells [D] . Palomaki, Peter Karl Bunk. 2012

机译：通过铜（I）的卟啉多层膜的逐层制造 - 催化αzidide-alkyne环加成：膜性质和染料敏化太阳能电池的应用
6. Fabrication of Nanopillar Crystalline ITO Thin Films with High Transmittance and IR Reflectance by RF Magnetron Sputtering [O] . Ling Dong, Guisheng Zhu, Huarui Xu, 2019

机译：射频磁控溅射制备高透射率和红外反射率的纳米柱状结晶ITO薄膜
7. Determination of optical constants in the near infrared of evaporated metal films from reflectance, transmittance and film thickness measurements [O] . Oldham, Max Spencer 1949

机译：通过反射率，透射率和膜厚测量来确定蒸发金属膜的近红外中的光学常数
8. Advances in the reduction and compensation of film stress in high- reflectance multilayer coatings for extreme ultraviolet lithography applications [R] . Mirkarimi, P. B. 1998

机译：用于极紫外光刻应用的高反射率多层涂层中薄膜应力的减少和补偿的进展

Recurrence Formulae for the Reflectance And Transmittance of Multilayer Films with Applications

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