首页> 外文OA文献 >Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

【2h】

Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

机译：多层硫属化物薄膜缺陷结构原子分辨率分析

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
D.L. Medlin; R. Fischer; R. Gannon; D.M. Hamann; D.C. Johnson;
展开▼
作者单位

展开▼
年度 2019
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Local atomic structure and lattice defect analysis in heavily Co-doped ZnS thin films using X-ray absorption fine structure spectroscopy [J] . Hoy-Benitez J. A., Colina-Ruiz R. A., Lezama-Pacheco J. S., The journal of physics and chemistry of solids . 2020,第1期

机译：使用X射线吸收细结构光谱分析局部掺杂ZnS薄膜的局部原子结构和晶格缺陷分析
2. Atomic structure and short- and medium-range order parameters in amorphous chalcogenide films prepared by different methods [J] . Sh.Sh. Sarsembinov, O.Yu. Prikhodko, A.P. Ryaguzov, Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites . 2007,第18a21期

机译：不同方法制备的非晶硫族化物薄膜的原子结构和中短程参数
3. Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr3Al2O6 using atomic resolution electron microscopy [J] . David J. Baek, Di Lu, Yasuyuki Hikita, APL Materials . 2017,第9期

机译：利用原子分辨电子显微镜通过水溶性缓冲层Sr3Al2O6上的外延氧化物薄膜中的晶格缺陷映射阳离子扩散
4. Real-time defect detection in transparent multi-layer polymer films using structured illumination and 1D filtering [C] . Walter Michaeli, Klaus Berdel, Oliver Osterbrink Conference on optical measurement systems for industrial inspection VI . 2009

机译：使用结构化照明和一维滤波实时检测透明多层聚合物膜中的缺陷
5. Characterization of Atomic Structure, Relaxation and Phase Transformation Mechanisms in Bulk and Thin Film Amorphous Chalcogenides and Gallium Antimonide. [D] . Edwards, Trenton Gerard. 2014

机译：体和薄膜非晶硫族化物和锑化镓中原子结构，弛豫和相变机理的表征。
6. Atomic Resolution Interfacial Structure of Lead-free Ferroelectric K0.5Na0.5NbO3 Thin films Deposited on SrTiO3 [O] . Chao Li, Lingyan Wang, Zhao Wang, -1

机译：SrTiO3上沉积的无铅铁电K0.5Na0.5NbO3薄膜的原子分辨界面结构
7. Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr3Al2O6 using atomic resolution electron microscopy [O] . David J. Baek, Di Lu, Yasuyuki Hikita, 2017

机译：利用原子分辨率电子显微镜绘制外延氧化物薄膜sr3al2O6中的阳离子扩散通过晶格缺陷

Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

著录项

引文网络

相似文献

相关主题

期刊订阅