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Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

机译：通过扫描X射线纳米微观显微镜和电子反向散射衍射拓扑绝缘体Bi2Te3和Bi2Se3外延薄膜的双域成像

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Dominik Kriegner; Petr Harcuba; Jozef Veselý; Andreas Lesnik; Guenther Bauer; Gunther Springholz; Václav Holý;
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1. Suppressing Twin Domains in Molecular Beam Epitaxy Grown Bi2Te3 Topological Insulator Thin Films [J] . Kampmeier Joern, Borisova Svetlana, Plucinski Lukasz, Crystal growth & design . 2015,第1期

机译：抑制分子束外延生长Bi2Te3拓扑绝缘体薄膜中的双畴
2. Epitaxial BaTiO_3(100) films on Pt(100): A low-energy electron diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy study [J] . Frster S., Huth M., Schindler K.-M., The Journal of Chemical Physics . 2011,第10期

机译：Pt（100）上的外延BaTiO_3（100）膜：低能电子衍射，扫描隧道显微镜和X射线光电子能谱研究
3. Molecular beam epitaxy of bilayer Bi(111) films on topological insulator Bi2Te3: A scanning tunneling microscopy study [J] . Chen Mu, Peng Jun-Ping, Zhang Hui-Min, Applied Physics Letters . 2012,第8期

机译：拓扑绝缘体Bi2Te3上双层Bi（111）薄膜的分子束外延：扫描隧道显微镜研究
4. Experimental Evidence of THz-LSPR in Microstructures Patterned Bi2Se3 Topological Insulator Thin Films [C] . H. Sugimoto, H. Tabata International Conference on Infrared, Millimeter, and Terahertz Waves . 2020

机译：Thz-LSPR在微结构中的实验证据图案化Bi2Se3拓扑绝缘体薄膜
5. The growth of epitaxial iron oxides on platinum (111) as studied by x-ray photoelectron diffraction, scanning tunneling microscopy, and low-energy electron diffraction. [D] . Kim, Yong-Joo. 1995

机译：通过X射线光电子衍射，扫描隧道显微镜和低能电子衍射研究了外延氧化铁在铂（111）上的生长。
6. Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction [O] . Dominik Kriegner, Petr Harcuba, Jozef Veselý, -1

机译：通过扫描X射线纳米束显微镜和电子背散射衍射在拓扑绝缘体Bi2Te3和Bi2Se3外延薄膜中进行双畴成像
7. Twin domain mapping in topological insulator Bi2X3 (X=Se,Te) by scanning XRD and electron backscattering diffraction [O] . Dominik Kriegner, Petr Harcuba, Andreas Lesnik, 2016

机译：通过扫描XRD和电子反向散射衍射拓扑绝缘体Bi2x3（X = SE，TE）的双域映射

Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

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