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The Effect of the Error in X-Ray Incident Angle Perpendicular to the Scanning Plane of X-Ray Detector on the Stress Measurement by X-Ray Diffraction

机译：X射线入射角垂直于X射线检测器扫描平面的误差对X射线衍射应力测量的影响

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Masanori KURITA;
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年度 1977
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1. Rocking Curves in the Laue Geometry Depending on the Departure of Incident Plane X-ray Wave from the Bragg Condition in the Diffraction Plane and in the Direction Perpendicular to the Diffraction Plane [J] . Balyan M. K. Journal of contemporary physics . 2017,第1期

机译：Laue几何中的摇摆曲线，取决于入射平面X射线波从衍射平面中的布拉格条件的偏离和垂直于衍射平面的方向
2. Improvement of X-ray stress measurement from a Debye-Scherrer ring by oscillation of the X-ray incident angle [J] . Miyazaki Toshiyuki, Maruyama Yoichi, Fujimoto Yohei, Powder diffraction . 2015,第3期

机译：通过X射线入射角的振荡改善Debye-Scherrer环的X射线应力测量
3. Online wide-angle X-ray diffraction/small-angle X-ray scattering measurements for the CO2-laser-heated drawing of poly(ethylene terephthalate) fiber [J] . Yamaguchi T, Komoriyama K, Ohkoshi Y, Journal of Polymer Science, Part B. Polymer Physics . 2005,第9期

机译：聚对苯二甲酸乙二醇酯纤维的CO2激光加热拉伸的在线广角X射线衍射/小角X射线散射测量
4. A conceptual design of hard X-ray focal plane detector for simultaneous x-ray polarimetric, spectroscopic, and timing measurements [C] . S. V. Vadawale, T. Chattopadhyay Conference on space telescopes and instrumentation . 2012

机译：硬X射线焦平面探测器的概念设计，用于同时进行X射线偏振，光谱和定时测量
5. X-RAY DIFFRACTION MEASUREMENT OF RESIDUAL STRESS (STRAIN): ENERGY DISPERSIVE X-RAY RESIDUAL STRESS MEASUREMENT. [D] . ROSEMEIER, RONALD GEORGE. 1981

机译：残余应力（应力）的X射线衍射测量：能量色散X射线残余应力测量。
6. Phase Transition and Melt-Recrystallization Behavior of Poly(Butylene Adipate) Investigated by Simultaneous Measurements of Wide-Angle X-Ray Diffraction (WAXD) and Differential Scanning Calorimetry (DSC) [O] . Mengfan Wang, Weiyu Cao 2020

机译：通过同时测量宽角X射线衍射（WAXD）和差示扫描量热法（DSC）研究了聚己二酸丁二酯的相变和熔体重结晶行为
7. Effect of Error in X-Ray Incident Angles on the Stress Value Measured by X-Ray Diffraction [O] . Masanori KUTIRA 1976

机译：X射线入射角误差对X射线衍射测量应力值的影响

The Effect of the Error in X-Ray Incident Angle Perpendicular to the Scanning Plane of X-Ray Detector on the Stress Measurement by X-Ray Diffraction

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