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AN IMPROVED ALGORITHM FOR DEDUCING COMPLEX PERMITTIVITY OF THIN DIELECTRIC SAMPLES WITH THE TRANSMISSION/REFLECTION METHOD

机译：一种改进算法，用于用透射/反射方法推出薄电介质样本复杂介电常数

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Minghui Ding; Yanqing Liu; Xinru Lu; Yifeng Li; Weizhong Tang;
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专利

1. Improved technique for determining complex permittivity with the transmission/reflection method [J] . Baker-Jarvis J., Vanzura E.J. IEEE Transactions on Microwave Theory and Techniques . 1990,第8期

机译：用透射/反射法确定复介电常数的改进技术
2. Calibration-Independent and Position-Insensitive Transmission/Reflection Method for Permittivity Measurement With One Sample in Coaxial Line [J] . Caijun Z., Quanxing J., Shenhui J. Electromagnetic Compatibility, IEEE Transactions on . 2011,第3期

机译：同轴线中一个样品的介电常数测量的与标定无关且对位置不敏感的透射/反射方法
3. A Fast and Accurate Amplitude-Only Transmission-Reflection Method for Complex Permittivity Determination of Lossy Materials [J] . Hasar U.C. IEEE Transactions on Microwave Theory and Techniques . 2008,第9期

机译：一种快速，准确的纯振幅透射反射法，用于确定有损耗材料的复介电常数
4. COAXIAL LINE REFLECTION METHOD FOR DIELECTRIC PERMITTIVITY OF THIN FILM SAMPLES AT MICROWAVE FREQUENCIES: NUMERICAL AND EXPERIMENTAL ANALYSIS [C] . J. Obrzut Annual International Microwave Symposium . 2006

机译：微波频率下薄膜样品介电介电常数的同轴线反射方法：数值和实验分析
5. Assessment of reflection and transmission techniques for determining dielectric properties of bulk wheat samples. [D] . Suresh Babu, Govindarajan. 2005

机译：评估反射和透射技术以确定散装小麦样品的介电性能。
6. High-permittivity thin dielectric pad improves peripheral non-contrast MRA at 3T [O] . Marc D Lindley, Daniel Kim, Glen Morrell, 2014

机译：高介电常数薄介电垫可改善3T时的外围无反差MRA
7. A stepwise transmission/reflection multiline-based algorithm for broadband permittivity measurements of dielectric materials [O] . Marco Degiorgi, Filippo Costa, Nunzia Fontana, 2016

机译：基于逐步传输/反射多线的电介质材料宽带介电常数测量算法
8. Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability. [R] . Baker-Jarvis, J., Janezic, M. D., Grosvenor, J. H., 1992

机译：用于测量介电常数和磁导率的透射/反射和短路线方法。

AN IMPROVED ALGORITHM FOR DEDUCING COMPLEX PERMITTIVITY OF THIN DIELECTRIC SAMPLES WITH THE TRANSMISSION/REFLECTION METHOD

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