首页> 外文OA文献 >Improvement of the Method of Measuring In-plane, Normal Strain Using Interferometry of Diffraction Beams

【2h】

Improvement of the Method of Measuring In-plane, Normal Strain Using Interferometry of Diffraction Beams

机译：衍射光束干涉测量法测量平面中的测量方法的改进

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Kazunori KATO; Tadao MUROTA;
展开▼
作者单位

展开▼
年度 1981
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Characterization of in-plane strain relaxation in strained layers using a newly developed plane nano-beam electron diffraction (plane-NBD) method [J] . K Usuda, T Irisawa, T Numata, Semiconductor science and technology . 2007,第1期

机译：使用新开发的平面纳米束电子衍射（plane-NBD）方法表征应变层中的面内应变松弛
2. High resolution grazing-incidence in-plane x-ray diffraction for measuring the strain of a Si thin layer [J] . Omote K. Journal of Physics. Condensed Matter . 2010,第47期

机译：用于测量Si薄层应变的高分辨率掠入射平面X射线衍射
3. A CARRIER METHOD OF SPECKLE-SHEARING INTERFEROMETRY FOR INDIVIDUAL-COMPONENT PATTERNS OF IN-PLANE STRAIN [J] . Fang J., Laermann KH. Optics & Laser Technology . 1995,第3期

机译：平面应变个别分量模式的斑点剪切干涉法的载体方法
4. Measuring accuracy of in-plane and out-of-plane deformation simultaneous measurement of speckle interferometry using multi-recording method [C] . Y.Arai Dimensional Optical Metrology and Inspection for Practical Applications IV . 2015

机译：多重记录法同时测量面内和面外变形的准确性
5. Measurement of lattice strain and relaxation effects in strained silicon using x -ray diffraction and convergent beam electron diffraction [D] . Diercks, David Robert. 2007

机译：使用X射线衍射和会聚光束电子衍射测量应变硅的晶格应变和弛豫效应
6. Three-beam convergent-beam electron diffraction for measuring crystallographic phases [O] . Yueming Guo, Philip N. H. Nakashima, Joanne Etheridge 2018

机译：三束会聚电子衍射仪用于测量结晶相
7. Improvement on the Method of Measuring In-Plane, Normal Strain Using Interferometry of Diffraction Beams [O] . Kazunori KATO, Tadao MUROTA 1980

机译：用衍射梁干涉测量测量平面内常规应变的方法
8. On Speckle Diffraction Interferometry for Measuring Whole Field Displacements and Strains. [R] . adams,frank d. maddux,gene e. 1974

机译：关于全场位移和应变测量的散斑衍射干涉测量。

Improvement of the Method of Measuring In-plane, Normal Strain Using Interferometry of Diffraction Beams

著录项

引文网络

相似文献

相关主题

期刊订阅