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Effect of Substrate Type on the Fractal Characteristics of AFM Images of Sputtered Aluminium Thin Films

机译：基材类型对溅射铝薄膜AFM图像分形特性的影响

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Fredrick Madaraka MWEMA; Esther Titilayyo AKINLABI; Oluseyi Philip OLADIJO;
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2. Characteristics of N-Type Polycrystalline Silicon Thin Films on Glass Substrates Deposited at Room Temperature by Direct Current Magnetron Sputtering under Substrate Biases [J] . Min Yen Yen, Chin Cheng Lee, Guan Yeu Tzeng, Japanese journal of applied physics . 2009,第5issue1期

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3. FRACTAL RESEARCH ON AFM IMAGES OF POLYCRYSTALLINE ALUMINIUM SURFACE WITH ADSORPTION FILM OF INHIBITOR SDS [J] . JUN-E QU, XING-PENG GUO, ZHEN-YU CHEN Физико-химическая механика материалов: Науч.-техн. журн. . 2009,第1期

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4. Effect of AFM Scan Size on the Scaling Law of Sputtered Aluminium Thin Films [C] . F. M. Mwema, Esther T. Akinlabi, O. P. Oladijo, International Conference on Mechanical, Manufacturing and Plant Engineering . 2020

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Effect of Substrate Type on the Fractal Characteristics of AFM Images of Sputtered Aluminium Thin Films

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