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The Physical Nature and Methodological Grounds of Diagnostics with Use of Effect of Asymmetry of Azimuthal Dependence of the Total Integrated Intensity of a Dynamical X-Ray Diffraction in Crystals with the Disturbed Surface Layer

机译：用干扰表面层晶体中晶体总体X射线衍射总集成强度的表方依赖性的效果诊断的物理性质和方法论探害

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V. B. Molodkin; A. I. Nizkova; E. I. Bogdanov; V. V. Lizunov; N. G. Tolmachev; S. V. Dmitriev; Y. V. Vasylyk; S. V. Lizunova; A. G. Karpov; O. G. Voitok; V. P. Pochekuev;
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1. Integrated intensities in Laue-Bragg cases for non-absorbing crystals in X-ray dynamical diffraction [J] . Takashi Saka Physica status solidi . 2009,第8期

机译：X射线动态衍射中非吸收性晶体在Laue-Bragg情况下的积分强度
2. INFLUENCE OF THE OUTER SURFACE LAYERS OF CRYSTALS ON THE X-RAY DIFFRACTION INTENSITY OF BASAL REFLECTIONS [J] . BORIS A. SAKHAROV, ALAIN PLANCON, BRUNO LANSON, Clays and clay minerals . 2004,第6期

机译：晶体的外表面层对基底反射的X射线衍射强度的影响
3. Intensity asymmetry of the (00) diffracted spin-polarized electron beam scattered from W(110): Azimuthal dependence [J] . Sergey Samarin, James Williams, Oleg Artamonov, Applied Physics Letters . 2013,第25期

机译：从W（110）散射的（00）衍射自旋极化电子束的强度不对称：方位角依赖性
4. The new principle for intensity calculation of X-rays dynamically diffracted in single crystals with defects [C] . A M Yeghiazaryan, K M Gevorgyan, A K Atanesyan International Symposium on Radiation from Relativistic Electrons in Periodic Structures . 2014

机译：X射线强度计算的新原理在单晶中动态衍射，缺陷
5. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [O] . Sérgio L. Morelhão, Cláudio M. R. Remédios, Guilherme A. Calligaris, -1

机译：氨基酸晶体中的X射线动态衍射：通过物理相测量提高生物分子结构分辨率的步骤
6. Heuristic Model of Deformation Dependence of Total Integrated Intensity of Dynamical Diffraction for Diagnostics of Single Crystals with Defects of Several Types [O] . V. B. Molodkin, H. I. Nyzkova, V. V. Lizunov, 2018

机译：具有若干型缺陷的单晶诊断动态衍射总集成强度的变形依赖性的启发式模型
7. Diffraction Efficiency and Relative Intensity of Various X-Ray Analyzing Crystals at Cu/sub K alpha /and SN/sub K alpha /Wavelengths and with Two Surface Conditions. [R] . sellick, b. o. sr 1978

机译：各种X射线分析晶体在Cu / subKα/和sN / subKα/波长和两种表面条件下的衍射效率和相对强度。

The Physical Nature and Methodological Grounds of Diagnostics with Use of Effect of Asymmetry of Azimuthal Dependence of the Total Integrated Intensity of a Dynamical X-Ray Diffraction in Crystals with the Disturbed Surface Layer

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