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Quantitative Phase Analysis of Skarn Rocks by the Rietveld Method Using X-ray Powder Diffraction Data

机译:利用X射线粉衍射数据测量矽卡岩岩石岩石的定量相分析

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摘要

The Rietveld method using X-ray powder diffraction data was applied to selected skarn samples for quantitative determination of the present minerals. The specimens include garnet, clinopyroxene–garnet, plagioclase–clinopyroxene–wollastonite–garnet, plagioclase–clinopyroxene–wollastonite, plagioclase–clinopyroxene–wollastonite–epidote, and plagioclase–clinopyroxene skarns. The rocks are coarse- to fine-grained and characterized by an uneven distribution of the constituent minerals. The traditional methods for quantitative analysis (point-counting and norm calculations) are not applicable for such inhomogeneous samples containing minerals with highly variable chemical compositions. Up to eight individual mineral phases have been measured in each sample. To obtain the mineral quantities in the skarn rocks preliminary optical microscopy and chemical investigation by electron probe microanalysis (EPMA) were performed for the identification of some starting components for the Rietveld analysis and to make comparison with the Rietveld X-ray powder diffraction results. All of the refinements are acceptable, as can be judged by the standard indices of agreement and by the visual fits of the observed and calculated diffraction profiles. A good correlation between the refined mineral compositions and the data of the EPMA measurements was achieved.
机译:使用X射线粉末衍射数据进行Rietveld方法应用于所选夕样品定量测定本矿物质。试样包括石榴石,单斜辉石,石榴石,斜长石 - 斜辉石 - 硅灰石石榴石,斜长石 - 斜辉石,硅灰石,斜长石 - 斜辉石 - 硅灰石-绿帘石,斜长石和,单斜辉石矽卡。岩石是粗粒到细粒并且其特征在于所述组成矿物的不均匀分布。用于定量分析(点计数和范数的计算)的传统的方法是不适用于包含具有高度可变的化学组成的矿物,例如不均匀的样品。多达八个单独的矿物相已经在每个样品中测量的。在矽卡获取矿物的量为岩石的Rietveld分析,并与里特沃尔德X射线粉末衍射结果使得比较一些起始组分的鉴定进行了初步光学显微镜和通过电子探针显微分析(EPMA)的化学研究。所有的改进的是可接受的,如可以通过协议的标准指标与由所观察到的和计算出的衍射曲线的拟合的视觉来判断。被取得的精制矿物组合物和EPMA测量的数据之间的良好相关性。

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