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Accelerating Voltage Dependence of the Measured X-ray Intensity from Elements of Low Atomic Number and its Depth Distribution

机译：从低原子数和深度分布的元素加速测量X射线强度的电压依赖性

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Akira Watanabe; Goro Ohira;
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年度 1973
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1. About the dependence of the intensity of X-ray spectra of elements on their concentrations expressed in atomic and mass percents [J] . Ilin NP Journal of analytical chemistry . 2007,第11期

机译：关于元素的X射线光谱强度对其原子浓度和质量百分比表示的浓度的依赖性
2. K β / K α X-ray intensity ratios for some elements in the atomic number range 28≤Z≤39?at 16.896?keV [J] . R. Y?lmaz Journal of Radiation Research and Applied Sciences . 2017,第3期

机译： K β / k α 某些元素的X射线强度比在16.896？keV时原子序数范围28≤Z≤39？
3. Elemental mapping at the atomic scale using low accelerating voltages [J] . Gianluigi A. Botton, Sorin Lazar, Christian Dwyer Ultramicroscopy . 2010,第8期

机译：使用低加速电压在原子尺度上进行元素映射
4. Influence of non-maxwellian electron distribution in low-Z elements iluminated by a high intensity X-ray laser [C] . Alberto G. de la Varga, Francois de Gaufridy, Pedro Velarde, Nonlinear optics and applications VII . 2013

机译：高强度X射线激光照射低Z元素中非麦克斯韦电子分布的影响
5. Alaska Snow Depth and Water Equivalent Snow Depth: An Analysis of Relationships and the Distributions of Measured Data [D] . Meehleis, Kurt A. 2018

机译：阿拉斯加雪深和水当量雪深：测量数据的关系和分布分析
6. Synchrotron Radiation X-Ray Microfluorescence Reveals Polarized Distribution of Atomic Elements during Differentiation of Pluripotent Stem Cells [O] . Simone C. Cardoso, Mariana P. Stelling, Bruna S. Paulsen, 2011

机译：同步辐射X射线微量荧光揭示的多能干细胞分化过程中的原子元素的极化分布
7. Figure 14: (A) Distribution of carbonyl (red) compared to the distribution of other compounds (cyan) in a 65 × 50 µm area of the sample. This area was measured in 0.1 µm steps. A layer of skin, identified by the yellow rectangle and predominantly composed of carbonyl, can be seen diagonally at the top-left corner of the image. The white arrow points towards the top of the skin. The red box represents the area detailed in (B). (B) Carbonyl (288.5 eV) map of the area within the red rectangle depicted in (A). The map covers an area of 20 × 20 µm of the sample in steps of 0.1 µm. The scale bar is 2 µm. Dark areas correspond to the presence of carbonyl (the data were collected with the detector in X-ray absorption mode). The yellow rectangle highlights a carbonyl layer which seems to be organized in smaller substructures, with three of them delineated by the white circles. (C) Elemental mapping of carbon (red), calcium (blue) and iron (green) of one of the substructures indicated by the white arrow in (B). [O] . -1

机译：图14：（a）与样品的65×50μm面积中的其他化合物（青色）的分布相比，羰基（红色）分布。该区域以0.1μm的步骤测量。由黄色矩形识别并主要由羰基构成的皮肤层可以在图像的左上角对角线地看到。白色箭头指向皮肤的顶部。红色框表示（b）中详述的区域。（b）（a）所示的红色矩形内区域内的区域的羰基（288.5 ev）图。该地图覆盖在0.1μm的步长的20×20μm的面积。秤条是2μm。暗区对应于羰基的存在（用X射线吸收模式用探测器收集数据）。黄矩形突出显示似乎在较小的子结构中组织的羰基层，其中三个被白色圆圈描绘。（c）由（b）中的白色箭头所示的一个子结构的碳（红色），钙（蓝色）和铁（绿色）的元素映射。
8. Summary of the Low Angle X-ray Atomic Scattering Factors Which Have Been Measured by the Critical Voltage Effect in High Energy Electron Diffraction (HEED) [R] . Fox, A. G. , Fisher, R. M. 1987

机译：高能电子衍射（HEED）中临界电压效应测量的低角度X射线原子散射因子综述

Accelerating Voltage Dependence of the Measured X-ray Intensity from Elements of Low Atomic Number and its Depth Distribution

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