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Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

机译：通过螺旋钻 - 电子光谱和X射线光电子能谱定量测定表面组合物的有效衰减长度

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A. Jablonski; C.J. Powell;
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1. Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy [J] . Jablonski A., Powell C. J. Journal of Electron Spectroscopy and Related Phenomena . 2017,第期

机译：通过螺旋钻 - 电子光谱和X射线光电子谱定量测定表面组合物的有效衰减长度
2. Electron effective attenuation lengths for applications in Auger-electron spectroscopy and x-ray photoelectron spectroscopy [J] . Powell CJ., Jablonski A. Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2002,第3期

机译：电子有效衰减长度，用于俄歇电子能谱和X射线光电子能谱
3. Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy [J] . Smekal W, Werner WSM, Powell CJ Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2005,第11期

机译：用于表面分析的电子光谱仿真（SESSA）：用于定量俄歇电子能谱和X射线光电子能谱的新型软件工具
4. Some Issues in Quantitative X-Ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy [C] . C. J. Powell, J. M. Conny, A. Jablonski International Symposium on State-of-the-Art Application of Surface and Interface Analysis Methods to Environmental Material Interactions: in Honor of James E.Castle's 65th Year, Mar 26-27, 2001, Washington D.C. . 2001

机译：定量X射线光电子能谱和俄歇电子能谱中的一些问题
5. Characterization of activated carbon surface composition by isoperibol calorimetry and x-ray photoelectron spectroscopy. [D] . Shmeis-Ziadeh, Rama Ali Abu. 1999

机译：活性炭的表面组成的表征通过等温量热法和X射线光电子能谱。
6. Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy [O] . A. Jablonski, C. J. Powell -1

机译：通过俄歇电子能谱和X射线光电子能谱定量测定表面成分的有效衰减长度
7. Quantitative Surface Analysis by Xps (X-Ray Photoelectron Spectroscopy): Application to Hydrotreating Catalysts Analyse quantitative de surface par XPS (X-ray photoelectron spectroscopy) : application aux catalyseurs d'hydrotraitement [O] . Beccat P., Da Silva P., Huiban Y., 2006

机译：Xps定量表面分析（X射线光电子能谱）：在加氢处理催化剂中的应用分析定量XPS定量表面分析（X射线光电子能谱）：氢辅助催化剂的应用

Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

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