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Correction of Specimen Orientation in Three-Dimensional Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument (2nd Report)

机译：用触控器仪表校正表面粗糙度三维测量标本取向（第2篇报表）

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Nahmgyoo CHO; Tadao TSUKADA; Masaaki TAKAHASHI;
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年度 1994
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3. Roughness measurement using optical profiler with self-reference laser and stylus instrument - A comparative study [J] . Chand M, Mehta A, Sharma R, Indian Journal of Pure & Applied Physics . 2011,第5期

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4. Comparison of Roughness Measurements between a Contact Stylus Instrument and an Optical Measurement Device based on a Colour Focus Sensor [C] . R. Danzl, F. Helmli, S. Scherer Nano Science and Technology Institute(NSTI) Nanotechnology Conference and Trade Show(NSTI Nanotech 2006) vol.3 . 2006

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5. INFLUENCE OF SURFACE ROUGHNESS AND WAVINESS ON THE FILM THICKNESS AND THEPRESSURE DISTRIBUTION IN ELASTOHYDRODYNAMIC CONTACTS. [D] . CHOW, LORAC SHIU-HAY -1

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6. In vitro evaluation of modified surface microhardness measurement focus variation 3D microscopy and contact stylus profilometry to assess enamel surface loss after erosive–abrasive challenges [O] . Milán Gyurkovics, Tommy Baumann, Thiago Saads Carvalho, -1

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7. Correction of Specimen Orientation in Three-Dimensional Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument (1st Report) [O] . Nahmgyoo CHO, Tadao TSUKADA, Masaaki TAKAHASHI 1994

机译：用触控器仪表校正三维测量三维测量的样本取向（第1篇报告）
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Correction of Specimen Orientation in Three-Dimensional Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument (2nd Report)

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