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Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence

机译：通过快速高能X射线总散射在放牧发病率下的薄膜局部原子结构

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Ann-Christin Dippel; Martin Roelsgaard; Ulrich Boettger; Theodor Schneller; Olof Gutowski; Uta Ruett;
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1. Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence [J] . Dippel A.-C., Roelsgaard M., Boettger U., IUCrJ . 2019,第2期

机译：掠入射时通过高能X射线快速全散射实现薄膜和超薄膜的局部原子结构
2. Structural analyses of sphere- and cylinder-forming triblock copolymer thin films near the free surface by atomic force microscopy, X-ray photoelectron spectroscopy, and grazing-incidence small-angle X-ray scattering [J] . Rasha Ahmed Hanafy Bayomi, Takashi Aoki, Takuma Shimojima, Polymer: The International Journal for the Science and Technology of Polymers . 2018,第期

机译：通过原子力显微镜，X射线光电子体光谱，X射线光电子体光谱和放牧发生小角X射线散射的球形和圆柱形三嵌段共聚物薄膜的结构分析
3. Grazing-incidence small-angle X-ray scattering from thin polymer films with lamellar structures-the scattering cross section in the distorted-wave Born approximation [J] . Busch P, Rauscher M, Smilgies DM, Journal of Applied Crystallography . 2006,第3期

机译：具有层状结构的聚合物薄膜的掠入射小角度X射线散射-扭曲波Born近似中的散射截面
4. Grazing Incidence Small Angle X-ray Scattering Studies on Structures of Block Copolymers in Nanoscale Thin films [C] . Byeongdu Lee, Insun Park, Jinhwan Yoon PMSE Symposia . 2005

机译：纳米薄膜嵌段共聚物结构的放牧发病率小角度X射线散射研究
5. Grazing incidence small angle x-ray scattering: Technique and application to discontinuous thin films. [D] . Levine, Joanne Rachel. 1990

机译：掠入射小角度X射线散射：不连续薄膜的技术和应用。
6. Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence [O] . Ann-Christin Dippel, Martin Roelsgaard, Ulrich Boettger, 2019

机译：掠入射时通过高能X射线快速全散射研究薄膜和超薄膜的局部原子结构
7. Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle x-ray scattering [O] . Dendooven, Jolien, Devloo-Casier, Kilian, Ide, Matthias, 2015

机译：基于原子层沉积的介孔薄膜孔径调整通过原位掠入射研究薄膜的小角度X射线散射
8. Characterization of Thin Films and Layered Structures Using X-Ray Absorption and Reflection at Grazing Incidence [R] . Heald, S. M., Tranquada, J. M., Welch, D. O., 1984

机译：利用X射线吸收和反射在放牧发生率下表征薄膜和分层结构

Local atomic structure of thin and ultrathin films via rapid high-energy X-ray total scattering at grazing incidence

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