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Piezoelectrics: Large Local-Compressive Stress-Induced Improvements in Piezoelectric Characteristics of Lead Zirconate Titanate Thin Films on a Ni Nanodots Array (Adv. Electron. Mater. 7/2018)

机译：压电：Ni纳米蛋白阵列中铅锆钛薄膜引线锆钛薄膜压电特性的大型局部压缩应力诱导的改进（ADV。电子。7/2018）

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Chan Su Han; Ahra Cho; Da Bin Kim; Yong Soo Cho;
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1. Piezoelectric properties of a near strain-free lead zirconate titanate thin films deposited on a Si substrate [J] . Ohno Tomoya, Fukumitsu Kentaroh, Honda Takamasa, Materials Letters . 2019,第MARa15期

机译：沉积在硅衬底上的近无应变锆钛酸铅钛薄膜的压电特性
2. Influence of Zr/Sn ratio on the Transverse Piezoelectric Coefficient in Lanthanum-Doped Lead Zirconate Titanate Stannate Thin Films [J] . Priya S. Laxmi, Kumar V, Kanno Isaku Integrated Ferroelectrics . 2019,第期

机译：Zr / Sn比对镧掺杂锆钛酸盐钛酸盐薄膜横向压电系数的影响
3. Surface Morphology, Microstructure, and Piezoelectric Response of Perovskite Islands in Lead Zirconate Titanate Thin Films [J] . Physics of the solid state . 2019,第12期

机译：铅锆钛钛薄膜铅锌岛的表面形态，微观结构和压电反应
4. Surface morphology and stress analysis of piezoelectric strontium-doped lead zirconate titanate thin films [C] . Sharath Sriram, Madhu Bhaskaran, Anthony S. Holland Conference on Micro-and Nanotechnology: Materials, Processes, Packaging, and Systems . 2007

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5. Lead zirconate titanate thin films for piezoelectric actuation and sensing of MEMS resonators. [D] . Piekarski, Brett Harold. 2005

机译：锆酸钛酸铅薄膜，用于压电激励和MEMS谐振器传感。
6. Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates [O] . Anuj Chopra, Muharrem Bayraktar, Maarten Nijland, -1

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7. Piezoelectrics: High Piezoelectric Performance and Phase Transition in Stressed Lead-Free (1 - x )(K, Na)(Sb, Nb)O3 -x (Bi, Na, K)ZrO3 Thin Films (Adv. Electron. Mater. 7/2017) [O] . Yumei Wang, Kui Yao, Xian Qin, 2017

机译：压电：高压电性能和相转变在压力无铅（1 - x）（K，Na）（Sb，Nb）O 3 -X（Bi，Na，K）ZrO3薄膜（ADV。电子。7 / 2017）

Piezoelectrics: Large Local-Compressive Stress-Induced Improvements in Piezoelectric Characteristics of Lead Zirconate Titanate Thin Films on a Ni Nanodots Array (Adv. Electron. Mater. 7/2018)

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