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Study of the absorption band in the range 0.3-0.9 eV inherent to solid solutions p-Ge1−xSix irradiated by fast electrons at the temperature 77 K

机译:在温度77k温度下通过快速电子照射的固体溶液P-GE1-Xsix的固体溶液P-GE1-Xsix的含量射频的研究

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摘要

Ge₁₋xSix solid solutions are one of promissing materials for semiconductor technique. However, their electrical and optical properties, especially with silicon content more than 5 at. % have been little studied. In particular, in the number of works [1-3] there have been presented the experimental results of study in the region 0.52 eV in germanium irradiated by fast electrons, gamma-rays and protons at the temperature of liquid nitrogen. In the literature, however, there are no data on studying the absorption band in the range 0.52 eV in Ge₁₋xSix solid solution irradiated by fast electrons.
机译:Ge₁₋xSix固溶体是半导体技术的重要材料之一。但是,它们的电学和光学特性,尤其是硅含量大于5 at。 %很少研究。特别是,在许多文献[1-3]中,已经提出了在液氮温度下,在快电子,伽马射线和质子辐照下的锗的0.52 eV范围内的实验研究结果。然而,在文献中,没有数据研究在快电子辐射的Ge₁₋xSix固溶体中0.52 eV范围内的吸收带。

著录项

  • 作者

    Sh. M. Abbasov;

  • 作者单位
  • 年度 2006
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
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