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Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack

机译：方法Cox-Strack测定欧姆触点与半导体板的接触电阻率

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R. B. Burlakov;
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年度 2018
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1. Ohmic contacts to moderately doped semiconductors—are they really Ohmic or low-barrier Schottky contacts? [J] . J Osvald Semiconductor science and technology . 2005,第6期

机译：欧姆接触到中等掺杂的半导体-它们是真正的欧姆接触还是低势垒肖特基接触？
2. Edge effect in ohmic contacts on high-resistivity semiconductors [J] . Arie Ruzin Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment . 2016,第JANa11期

机译：高阻半导体上欧姆接触的边缘效应
3. Simulating Downscaling of Ohmic Contacts on Wide-Bandgap Low-Resistivity Semiconductors [J] . Ruzin A. Electron Devices, IEEE Transactions on . 2012,第6期

机译：在宽带隙低电阻率半导体上模拟欧姆接触的按比例缩小
4. A New Mechanism of Contact Resistance Formation in Ohmic Contacts to Semiconductors with High Dislocation Density [C] . A.V. Sachenko, A.E. Belyaev, N.S. Boltovets, ICPS 2012 . 2013

机译：具有高脱位密度的欧姆触点接触电阻形成的新机制
5. Ohmic contacts to N-type gallium nitride based semiconductors. [D] . Selvanathan, Deepak. 2004

机译：与N型氮化镓基半导体的欧姆接触。
6. Ohmic-Rectifying Conversion of Ni Contacts on ZnO and the Possible Determination of ZnO Thin Film Surface Polarity [O] . Kim Guan Saw, Sau Siong Tneh, Gaik Leng Tan, -1

机译：ZnO上Ni接触的欧姆整流化及ZnO薄膜表面极性的可能确定
7. Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method [O] . Sheremet V.N. 2014

机译：用四接触法研究欧姆接触的比接触电阻率的计量学方面
8. Survey of ohmic contacts to III-V compound semiconductors [R] . Baca, A. G. , Zolper, J. C. , Briggs, R. D. , 1997

机译：对III-V族化合物半导体的欧姆接触的研究

Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack

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