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X-Ray Diffraction and Density Distribution Measurements on the Al2O3 Crystals Grown by Czochralski Method with Different Pull Rate

机译：X射线衍射和密度分布测量由Czochralski方法种植的Al2O3晶体，具有不同拉速

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Hamdan Hadi Kusuma;
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1. X-ray Diffraction of AuCl Semiconductor Nanocrystals Embedded in NaCl Single Crystals Grown by Czochralski Method [J] . F. Zehani, H. Zaioune Acta Physica Polonica . 2013,第2期

机译：直拉法生长在NaCl单晶中的AuCl半导体纳米晶体的X射线衍射
2. X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method [J] . M. Lefeld-Sosnowska, A. Malinowska Acta Physica Polonica . 2013,第2期

机译：X射线衍射形貌-直拉法生长的单晶的研究
3. X-ray diffraction study of the effect of neutron irradiation on the defect formation in silicon crystals grown by the Czochralski method and annealed at high temperatures [J] . Makara VA, Novikov NN, Patsai BD Physics of the solid state . 2005,第10期

机译：X射线衍射研究中子辐照对通过切克劳斯基方法生长并在高温下退火的硅晶体中缺陷形成的影响
4. X-ray Topography on La3Ta0.5Ga5.5O14 Single Crystal Grown by Czochralski method [C] . Yoneda Y., Mizuki J., Takeda H., IEEE International Symposium on the Applications of Ferroelectrics . 2007

机译：LA 3 TA 0.5 O 14 由Czochralski方法种植的单晶
5. Effect of texture development on elastic anisotropy in copper and brass sheet materials as predicted by crystallographic X-ray diffraction, ultrasonic velocity, and mechanical measurements [D] . Yu, Chin-Jye 1991

机译：晶体X射线衍射，超声速度和机械测量预测的织构发展对铜和黄铜片材材料弹性各向异性的影响
6. A comparison of respirable crystalline silica concentration measurements using a direct-on-filter Fourier transform infrared (FT-IR) transmission method vs. a traditional laboratory X-ray diffraction method [O] . Julie F. Hart, Daniel A. Autenrieth, Emanuele Cauda, -1

机译：使用直接滤器傅里叶变换红外（FT-IR）透射法与传统实验室X射线衍射法比较可吸入晶体二氧化硅浓度的比较
7. Measurement of Curvature Distributions in SiO_2-GaAs Substrate by X-ray Double-Crystal Method [O] . 前濱剛廣, 安冨祖忠信, Maehama Takehiro, 1991

机译：用X射线双晶体法测量SiO_2-GaAs衬底中的曲率分布。
8. Simulation of the temperature distribution in crystals grown by Czochralski method [R] . Dudokovic, M. P., Ramachandran, P. A. 1985

机译：Czochralski法生长晶体温度分布的模拟

X-Ray Diffraction and Density Distribution Measurements on the Al2O3 Crystals Grown by Czochralski Method with Different Pull Rate

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