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Effect of Zn Site for Ca Substitution on Optical and Microwave Dielectric Properties of ZnAl2O4Thin Films by Sol Gel Method

机译:Zn位点对CA取代对Znal2O4膜膜溶胶法的光学微波介电性能

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摘要

CaxZn(1-x)Al2O4 (x = 0.00, 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) thin films were prepared by a sol gel method. The XRD patterns displayed the characteristic peaks of (Ca/Zn)Al2O4 with the standard pattern of face-centred cubic (fcc). The addition of Ca decreased the lattice constant from 14.6 nm to 23.2 nm. The optical bandgap of undoped thin film was found to be at 3.84 eV while for doped Ca was observed at 3.50 to 3.73 eV. The substitution of Zn2+ by Ca2+ in ZnAl2O4 thin films was found to increase the crystallite size, grain size, and surface morphology which evidently affect the density and dielectric constant. The CaxZn1-xAl2O4 thin films were characterized at 20 to 1 MHZ frequency to determine the dielectric constant εr and unloaded quality factor Qu using LCR spectrometer. It can be observed that specimen using Ca0.25Zn0.75Al2O4 possesses εr~10.41 and Qu~5770 which is suggested as a candidate material for millimetre-wave applications. Therefore, this ceramic is suggested as a candidate material for GPS patch antennas.
机译:通过溶胶凝胶法制制备CaxZn(1-x)Al 2 O 4(x = 0.00,0.25,0.10,0.15,0.20,0.25和0.30)。 XRD图案显示了(CA / Zn)Al​​2O4的特征峰,标准图案的面为中心立方(FCC)。加入Ca从14.6nm至23.2nm降低晶格常数。未掺杂的薄膜的光学带隙被发现为3.84eV,而在3.50至3.73eV中观察到掺杂的Ca。发现Zn2 +在Znal2O4薄膜中取代Zn12O4薄膜以增加微晶尺寸,晶粒尺寸和表面形态,这显然影响了密度和介电常数。 Caxzn1-Xal2O4薄膜以20至1MHz的频率在20至1MHz的频率中表征,以确定使用LCR光谱仪确定介电常数εr和卸载质量因子qu。可以观察到使用CA0.25ZN0.75A12的标本具有εr〜10.41和Qu〜5770,其被建议为毫米波应用的候选材料。因此,该陶瓷被建议为GPS贴片天线的候选材料。

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