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Substrate bias effect on cycling induced performance degradation of flash EEPROMs

机译：衬底偏置对闪存EEPROM循环性能下降的影响

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MAHAPATRA S; SHUKURI S; BUDE JD;
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年度 2003
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1. A convergence scheme for over-erased flash EEPROM's using substrate-bias-enhanced hot electron injection [J] . Hu C.-Y., Kencke D.L. IEEE Electron Device Letters . 1995,第11期

机译：利用衬底偏置增强的热电子注入的过擦除闪存EEPROM的收敛方案
2. Impact of Source Junctions on the Performance and Cycling-Induced Degradation of Split-Gate Flash Memory [J] . Wei Zhao, Yue-Song He, Chunchieh Huang, Japanese journal of applied physics . 2010,第7ISSUE1期

机译：源结对分裂门闪存性能和循环退化的影响
3. Effect of substrate bias on the performance and reliability of the split-gate source-side injected flash memory [J] . Kuo-Ching Huang, Yean-Kuen Fang IEEE Electron Device Letters . 1999,第8期

机译：衬底偏压对分裂栅源极侧注入闪存的性能和可靠性的影响
4. Substrate bias effect on cycling induced performance degradation of flash EEPROMs [C] . Mahapatra, S., Shukuri, . 2003

机译：衬底偏置对闪存EEPROM循环引起的性能下降的影响
5. Study of degradation in tunneling oxide thin films in EEPROM and FLASH EEPROM test stuctures. [D] . Chen, Chun. 1997

机译：研究EEPROM和FLASH EEPROM测试结构中隧穿氧化物薄膜的退化。
6. Unequal misses during the flash-induced advancement of photosystem II: effects of the S state and acceptor side cycles [O] . Long Vo Pham, Julian David Janna Olmos, Petko Chernev, -1

机译：闪光诱导的光系统II前进过程中的不等失：S状态和受体侧循环的影响
7. Growth-substrate induced performance degradation in chemically synthesized monolayer MoS2ﾠfield effect transistors [O] . Amani Matin, Chin Matthew L., Mazzoni Alexander L., 2014

机译：化学合成的单层MoS2 ﾠ场效应晶体管中生长衬底引起的性能下降

Substrate bias effect on cycling induced performance degradation of flash EEPROMs

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