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The effects of varying tilt angle of halo implant on the performance of sub 100nm LAC MOSFETs

机译:晕轮注入的倾斜角变化对100nm以下LAC MOSFET性能的影响

摘要

In this paper we systematically investigate the effects of the varying tilt angle of the halo implants on the different device performance parameters of 100 nm lateral asymmetric channel (LAC) MOSFETs. The tilt angle is varied from 5deg to 60deg with twist angle 0deg. Substantial reduction of sub-threshold swing is found for large tilt angles as compared to low angles of halo implant. The device structure, known as lateral asymmetric channel with large angle tilt implant (LACLATI), exhibits better reverse short channel effect and I on/Ioff, and lower junction capacitance.
机译:在本文中,我们系统地研究了晕环植入物的不同倾斜角对100 nm横向非对称沟道(LAC)MOSFET的不同器件性能参数的影响。倾斜角在5度到60度之间变化,扭转角为0度。与大角度的光环植入物相比,对于大的倾斜角,发现亚阈值摆幅大大降低。该器件结构被称为具有大角度倾斜注入的横向非对称沟道(LACLATI),具有更好的反向短沟道效应和I on / Ioff,并且结电容更低。

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