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Synthesis and structural characterization of highly tetragonal (1-x)Bi(Znsub 1∕2Tisub 1∕2)-xPbTiOsub 3 piezoceramics

机译：高四方（1-X）Bi（Zn Sub 1/2 Ti Sub 1/2）的合成和结构表征 - XPBTIO Sub 3压电陶瓷

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We present here the comprehensive X-ray diffraction (XRD) and dielectricmeasurement of (1-x)Bi(Zn1/2Ti1/2)O3-xPbTiO3 (BZT-xPT) piezoceramics withx=0.65, 0.70, 0.75 and 0.80. Powder X-ray diffraction data reveals thetetragonal structure (space group P4mm) of BZT-xPT ceramics for all thecompositions.

机译：我们在这里提出的综合X射线衍射（XRD）和dielectricmeasurement（1-X）的Bi（的Zn1 / 2Ti1 / 2）O3-xPbTiO3（BZT-XPT）压电陶瓷withx = 0.65，0.70，0.75和0.80。粉末X射线衍射数据揭示了thetetragonal结构BZT-XPT陶瓷所有thecompositions的（空间群P4mm）。

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Jyoti Sharma; Rishikesh Pandey; Akhilesh Kumar Singh;
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Synthesis and structural characterization of highly tetragonal (1-x)Bi(Znsub 1∕2Tisub 1∕2)-xPbTiOsub 3 piezoceramics

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