Application of X-Ray Microtomography to the Microstructural Characterization of Al-Based Functionally Graded Materials

摘要

This paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned.