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Modification of the Properties of Vanadium Oxide Thin Films by Plasma-Immersion Ion Implantation

机译:等离子体浸渍离子注入改变氧化钒薄膜的性质

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摘要

The paper describes the effect of doping with hydrogen and tungsten by means of plasma-immersion ion implantation (PIII) on the properties of vanadium dioxide and hydrated vanadium pentoxide films. It is shown that the parameters of the metal-insulator phase transition in VO2 thin films depend on the hydrogen implantation dose. Next, we explore the effect of PIII on composition, optical properties, and the internal electrochromic effect (IECE) in V2O5·nH2O films. The variations in the composition and structure caused by the hydrogen insertion, as well as those caused by the electrochromic effect, are studied by nuclear magnetic resonance, thermogravimetry, Raman spectroscopy, and X-ray structural analysis. It is shown that the ion implantation-induced hydrogenation can substantially enhance the manifestation and performance of the IECE in V2O5 xerogel films. Finally, the effect of PIII-assisted doping with W on the parameters of electrical switching in Au/V2O5·nH2O/Au sandwich structures is examined. It is shown that implanting small tungsten doses improves the switching parameters after forming. When implanting large doses, switching is observed without electroforming, and if electroforming is applied, the switching effect, on the contrary, disappears.
机译:本文描述了通过对二氧化钒和水合钒五氧化钒膜的性质对氢气和钨的掺杂与钨和钨的影响。结果表明,VO2薄膜中的金属 - 绝缘体相转变的参数取决于氢气注入剂量。接下来,我们探讨PIII对V2O5·NH 2 O膜中的组成,光学性质和内部电致变色效果(IECE)的影响。通过核磁共振,热重量测定,拉曼光谱和X射线结构分析研究由氢插入和由电致变色效果引起的组成和结构的变化。结果表明,离子注入诱导的氢化可以显着提高IECE在V2O5 Xerogel薄膜中的表现和性能。最后,检查了PIII辅助掺杂对Au / V2O5·NH 2 O / AU夹层结构中电切换参数的影响。结果表明,植入小钨剂量在成型后改善了开关参数。当植入大剂量时,观察到切换而不电铸,如果施加电铸,则相反,切换效果消失。

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