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Correction to: Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions

机译：校正：考虑孔隙和下拉条件孔的微机电开关新型电容评估模型

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Rajesh Kumar;
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1. Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions (vol 26, pg 873, 2020) [J] . Kurmendra, Kumar Rajesh Microsystem technologies . 2020,第4期

机译：微机电开关的新型电容评价模型考虑孔的孔隙和下拉条件下孔的影响（Vol 26，PG 873,2020）
2. Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions [J] . Kurmendra, Kumar Rajesh Microsystem technologies . 2020,第3期

机译：微机电开关的新型电容评价模型考虑孔隙和下拉条件下孔的影响
3. Cryogenic Pull-Down Voltage of Microelectromechanical Switches [J] . Noel J. G., Bogozi A., Vlasov Y. A., Journal of Microelectromechanical Systems . 2008,第2期

机译：微机电开关的低温下拉电压
4. RF MEMS miniature-switched capacitors with pull-down and pull-up electrodes for high power applications [C] . Sedaghat-Pisheh H., Mahameed R., Rebeiz G. M. 2011 IEEE MTT-S International Microwave Symposium Digest . 2011

机译：具有下拉和上拉电极的RF MEMS微型开关电容器，适用于大功率应用
5. Impact of environmental conditions on the contact physics of gold contact RF microelectromechanical systems (MEMS) switches [D] . Brown, Christopher John 2008

机译：环境条件对金触点RF微机电系统（MEMS）开关的接触物理的影响
6. Fringe Capacitance Correction for a Coaxial Soil Cell [O] . Mathew G. Pelletier, Joseph A. Viera, Robert C. Schwartz, 2011

机译：同轴土壤电池的边缘电容校正
7. New Analytical Capacitance Modeling of the Perforated Switch Considering the Fringing Effect [O] . K. Srinivasa Rao, B. V. S. Sailaja, K. Girija Sravani, 2019

机译：考虑流苏效应的穿孔开关新的分析电容建模

Correction to: Novel capacitance evaluation model for microelectromechanical switch considering fringe and effect of holes in pull-up and pull-down conditions

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