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High temperature indentation behavior of eutectic lead-free solder materials

机译:共晶无铅焊料材料的高温压痕行为

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摘要

Electronic malfunction caused by thermal stresses is one major problem in modern electronic industries. Therefore, the precise knowledge of the mechanical solder material properties as a function of temperature is required. Nanoindentation and its potential of recording load-displacement curves is a widely-used miniature test for the determination of Young’s modulus and hardness values. Furthermore, such tests can be performed in a temperature range from Room Temperature (RT) up to +500°C by using a Hot-Stage add on. In this paper the lead-free solder alloys Sn91Zn9 and Sn42Bi58, and also copper and fused silica, which is used for the indenter calibration are investigated. The results for quartz and copper agree with the published values in several references. However, the Young’s modulus of Sn42Bi58 as a function of temperature differs from the values presented in the literature. Due to delayed material response in the unloading regime it must be assumed that creep effects lead to an incorrect automatic data evaluation. Investigation and understanding of the creep behavior is part of this paper. For this purpose a visco-elastic material model is used to model the indentation response at elevated temperatures and to determine the corresponding viscous material constants.
机译:热应力引起的电子故障是现代电子工业中的一个主要问题。因此,需要作为温度函数的机械焊料材料性能的精确知识。纳米intentation及其记录负荷 - 位移曲线的潜力是一种广泛使用的微型测试,用于确定杨氏模量和硬度值。此外,通过使用热级加法,可以在从室温(RT)的温度范围内的温度范围内进行这种测试。在本文中,研究了无铅焊料合金SN91ZN9和SN42BI58,以及用于压紧校准的铜和熔融二氧化硅。石英和铜的结果与几个参考文献中的已发布值同意。然而,作为温度函数的杨氏模量与文献中呈现的值不同。由于卸载制度中的材料响应延迟,必须假设蠕变效应导致不正确的自动数据评估。对蠕变行为的调查和理解是本文的一部分。为此目的,使用粘弹性材料模型用于在升高的温度下模拟压痕响应,并确定相应的粘性材料常数。

著录项

  • 作者

    W.H. Müllera; H. Worrack;

  • 作者单位
  • 年度 2010
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
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