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A Standard Sample Preparation Method for the Determination of Metal Impurities on a Silicon Wafer by Total Reflection X-Ray Fluorescence Spectrometry.

机译：通过全反射X射线荧光光谱法测定硅晶片上金属杂质的标准样品制备方法。

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Yoshihiro MORI; Kengo SHIMANOE; Tadashi SAKON;
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年度 1995
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1. Summary of ISO/TC 201 Standard: VI ISO 14706 : 2000 - Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy [J] . Gohshi Y. Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2002,第4期

机译：ISO / TC 201标准摘要：VI ISO 14706：2000-表面化学分析-通过全反射X射线荧光（TXRF）光谱法测定硅片上的表面元素污染
2. A solid phase extraction procedure for the simultaneous determination of total inorganic arsenic and trace metals in seawater: Sample preparation for total-reflection X-ray fluorescence [J] . B. Staniszewski, P. Freimann Spectrochimica Acta, Part B. Atomic Spectroscopy . 2008,第11期

机译：用于同时测定海水中总无机砷和痕量金属的固相萃取程序：全反射X射线荧光的样品制备
3. Summary of ISO/TC 201 Standard: XIX ISO 17331 : 2004 - Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection x-ray fluores [J] . Mori Y Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2005,第5期

机译：ISO / TC 201标准摘要：XIX ISO 17331：2004-表面化学分析-从硅晶片工作参考材料表面收集元素的化学方法，并通过全反射X射线荧光剂测定
4. Investigation of metallic contamination analysis using vapor phase decomposition - droplet collection - total reflection X-ray fluorescence (VPD-DC-TXRF) for Pt-group elements on silicon wafers [C] . David Hellin, Nick Valckx, Jens Rip, International Symposium on Ultra Clean Processing of Silicon Surfaces . 2008

机译：使用气相分解的金属污染分析研究 - 硅晶片Pt-Gafers的全反射X射线荧光（VPD-DC-TXRF）
5. Sample preparation methods for the determination of cadmium in urine by tungsten-coil electrothermal vaporization inductively coupled plasma atomic emission spectrometry. [D] . Davis, Amanda C. 2006

机译：钨线圈电热蒸发电感耦合等离子体原子发射光谱法测定尿中镉的样品制备方法
6. Development and Validation of a New Method for Determination of Pb and Cr in Marine Organisms by Total Reflection X-Ray Fluorescence (TXRF) Spectroscopy [O] . Blanca G. Beltrán, Ibiza Martínez-Serrano, Victor Ramos-Sanchez, 2019

机译：全反射X射线荧光光谱法测定海洋生物中铅和铬的新方法的建立和验证
7. Determination of Trace Impurities in Graphite and Silicon Carbide by Total Reflection X-ray Fluorescence Spectrometry after Homogeneous Liquid-Liquid Extraction. [O] . Hitoshi Yamaguchi, Shinji Itoh, Shukuro Igarashi, 2000

机译：通过全反射X射线荧光光谱法测定石墨和碳化硅中痕量杂质的含量液液萃取。

A Standard Sample Preparation Method for the Determination of Metal Impurities on a Silicon Wafer by Total Reflection X-Ray Fluorescence Spectrometry.

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