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A combined ion-sputtering and electron-beam annealing device for the in vacuo postpreparation of scanning probes

机译：一种组合离子溅射和电子束退火装置，用于体内预制备扫描探针

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Eder Georg; Schlögl Stefan; Macknapp Klaus; Heckl Wolfgang M.; Lackinger Markus;
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年度 2011
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正文语种 {"code":"en","name":"English","id":9}
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1. Study of the effect of annealing process on the performance of P3HT/PCBM photovoltaic devices using scanning-probe microscopy [J] . Huang Yu-Ching, Liao Yu-Chia, Li Shao-Sian, Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion . 2009,第6a7期

机译：扫描探针显微镜研究退火工艺对P3HT / PCBM光伏器件性能的影响
2. Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses [J] . Murase Yoshiharu, Masuda Hiroyuki, Katayama Hideki Materials transactions . 2020,第3期

机译：使用组合扫描的开尔文力探针显微镜和电子背散衍射分析，晶体取向与退火S45C钢表面电位的微结构依赖性
3. Electron-Beam Scanning of ZnS Crystals: A Thermal Comparison of CRTs and Field-Emission Devices [J] . Wael Yared Journal of Imaging Science and Technology . 1995,第5期

机译：ZnS晶体的电子束扫描：CRT和场发射器件的热比较
4. Features of combining scanning probe microscope with optical and scanning electron microscopes [C] . I D Sapozhnikov, O M Gorbenko, M L Felshtyn International Conference Scanning Probe Microscopy;Russia-China Workshop on Dielectric and Ferroelectric Materials;International Youth Conference Functional Imaging of Nanomaterials . 2020

机译：将扫描探针显微镜与光学扫描电子显微镜相结合的特点
5. Scanned Probe Spectroscopy of Traps in Cross-Sectioned AlGaN/GaN Devices [D] . ?Gleason, Darryl A. 2019

机译：跨剖面AlGaN / GaN设备中陷阱的扫描探针光谱
6. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices [O] . Urs Gysin, Thilo Glatzel, Thomas Schmölzer, 2015

机译：超高真空大面积扫描探针显微镜经演示可用于高压设备上的静电力测量
7. Application and Progress in the Scanning Probe Microscopy. Development of Single Electron Devices Fabricated by Scanning Tunneling Microscope(STM)/Atomic Force Microscope(AFM). [O] . Jun-ichi SHIRAKASHI, Masami ISHII, Kazuhiko MATSUMOTO 1997

机译：扫描探针显微镜中的应用和进展。通过扫描隧穿显微镜（STM）/原子力显微镜（AFM）制造的单电子器件的研制。

A combined ion-sputtering and electron-beam annealing device for the in vacuo postpreparation of scanning probes

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