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Growth of spatially ordered ZnO nanowire arrays for field emission applications

机译:用于场发射应用的空间有序ZnO纳米线阵列的生长

摘要

In this work the growth of spatially ordered and vertically aligned ZnO nanowires is examined. Nanowire arrays are grown using chemical bath deposition (CBD) and carbothermal reduction vapour phase transport (CTR-VPT) techniques. Nanosphere lithography (NSL) was used to achieve spatial ordering of these arrays; arrays with inter-wire distances of 500 nm, 1.0 μm, and 1.5 μm were grown using both CBD and CTR-VPT techniques. Two distinct implementations of the NSL technique are investigated, one which relied on the deposition of a catalyst material and one which involved the deposition of a secondary mask which prevents ZnO deposition from occurring in undesired areas. The field emission (FE) characteristics of these arrays were examined, revealing a significant dependence of the FE properties on both nanowire morphology and array density. A geometric factor is calculated which is dependent on both nanowire aspect ratio and the density of nanowires in an array and this factor has been found to correlate with other indicators of FE properties. The results presented in this work may be useful in informing the design of ZnO nanowire arrays in order to maximise their FE efficiency and uniformity.
机译:在这项工作中,检查了有序排列和垂直排列的ZnO纳米线的生长。纳米线阵列使用化学浴沉积(CBD)和碳热还原气相传输(CTR-VPT)技术生长。纳米球刻蚀(NSL)用于实现这些阵列的空间排序。使用CBD和CTR-VPT技术生长线间距离分别为500 nm,1.0μm和1.5μm的阵列。研究了NSL技术的两种不同的实现方式,一种依靠催化剂材料的沉积,另一种涉及辅助掩模的沉积,该掩模防止ZnO沉积在不希望的区域。检查了这些阵列的场发射(FE)特性,揭示了FE特性对纳米线形态和阵列密度的显着依赖性。计算几何因子,该几何因子取决于纳米线长宽比和阵列中纳米线的密度,并且已经发现该因子与有限元性能的其他指标相关。这项工作中提出的结果可能有助于通知ZnO纳米线阵列的设计,以最大程度地提高其FE效率和均匀性。

著录项

  • 作者

    Garry Seamus;

  • 作者单位
  • 年度 2013
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  • 原文格式 PDF
  • 正文语种 en
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