首页> 外文OA文献 >Element specific imaging in computer assisted tomography using a tube source of x-rays and a low resolution detector
【2h】

Element specific imaging in computer assisted tomography using a tube source of x-rays and a low resolution detector

机译:使用X射线管源和低分辨率检测器的计算机辅助断层扫描中的元件特异性成像

摘要

A new technique for element specific imaging inudcomputerised tomography has been developed. The techniqueudallows two or more elements to be imaged independently ofudthe matrix in which they are contained. The technique usesuda filtered tube source of x-rays and low energy resolutionuddetector.ududFractional transmittance measurements were recorded atuda number of tube potentials along each of the beam pathsudrequired for standard CT reconstruction. This data wasudused to obtain monochromatic information about theudabsorber. K-edge differential absorptiometry was then usedudto obtain the equivalent thickness of each element ofudinterest. Using the algebraic reconstruction techniqueud(ART), element specific images were generated. Theudtechnique was successfully used to separately image iodineudand barium distributed in a water matrix.ududIn a refinement of the technique, a single channeludanalyser was used to increase the percentage of counts inudthe fractional transmittance measurement providingudinformation about the elements of interest. Using thisudapproach, cadmium and indium, elements with a K-edgeudseparation of 1.23keV, were separately imaged. Theudtechnique was also tested for matrix independence andudlinearity using homogeneous samples.ududUsing computer simulations the optimum operatingudconditions and characteristics of the technique wereudexamined.ududFinally, future developments of the technique areuddiscussed along with a possible application.
机译:已经开发了一种用于计算机断层扫描中的特定于元素的成像的新技术。该技术允许两个或多个元素独立于包含它们的矩阵进行成像。该技术使用 uda过滤后的X射线管源和低能量分辨率 uddetector。 ud ud在沿每条光路的 u射线管电势数上记录了部分透射率测量对于标准CT重建而言,ud是必需的。该数据被用来获得关于吸收剂的单色信息。然后使用K边缘差分吸光光度法获得每个感兴趣元素的等效厚度。使用代数重建技术 ud(ART),可以生成元素特定的图像。 ud技术成功地用于分别成像分布在水基质中的碘 ud和钡。 ud ud在该技术的改进中,使用了单通道 udanalyser来增加透射分数测量中计数的百分比,从而提供有关感兴趣的元素的信息。使用这种 udapproach,镉和铟,分别对K边缘 udseparation为1.23keV的元素成像。 ud技术还使用均质样本测试了矩阵独立性和 u ^线性。 ud ud使用计算机模拟对技术的最佳操作 udcondition和特性进行了 udxamine。 ud ud最后,讨论了该技术的未来发展与可能的应用程序。

著录项

  • 作者

    Markham Charles Edward;

  • 作者单位
  • 年度 1993
  • 总页数
  • 原文格式 PDF
  • 正文语种 en
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号