首页> 外文OA文献 >Influence of ZnO nanowire array morphology on field emission characteristics
【2h】

Influence of ZnO nanowire array morphology on field emission characteristics

机译:ZnO纳米线阵列形貌对场发射特性的影响

摘要

In this work the growth and field emission properties of vertically aligned and spatially ordered and unordered ZnO nanowires are studied. Spatially ordered nanowire arrays of controlled array density are synthesised by both chemical bath deposition and vapour phase transport using an inverse nanosphere lithography technique, while spatially unordered arrays are synthesised by vapour phase transport without lithography. The field emission characteristics of arrays with 0.5 µm, 1.0 µm, and 1.5 µm inter-wire distances, as well as unordered arrays, are examined, revealing that with the range of values examined field emission properties are mainly determined by variations in nanowire height, and show no correlation with nanowire array density. Related to this, we find that a significant variation in nanowire height in an array also leads to a reduction in catastrophic damage observed on samples during field emission because arrays with highly uniform heights are found to suffer significant arcing damage. We discuss these results in light of recent computational studies of comparable nanostructure arrays and find strong qualitative agreement between our results and the computational predictions. Hence the results presented in this work should be useful in informing the design of ZnO nanowire arrays in order to optimise their field emission characteristics generally.
机译:在这项工作中,研究了垂直排列,空间有序和无序的ZnO纳米线的生长和场发射特性。利用逆纳米球光刻技术,通过化学浴沉积和气相传输,可以合成具有受控阵列密度的空间有序纳米线阵列,而无需光刻,可以通过气相传输来合成空间无序阵列。考察了线间距离为0.5 µm,1.0 µm和1.5 µm的阵列以及无序阵列的场发射特性,发现在所检查的值范围内,场发射特性主要取决于纳米线高度的变化,并且显示与纳米线阵列密度没有相关性。与此相关的是,我们发现阵列中纳米线高度的显着变化还可以减少在场发射期间在样品上观察到的灾难性损害,因为发现高度高度均匀的阵列会遭受明显的电弧损坏。我们根据可比的纳米结构阵列的最新计算研究来讨论这些结果,并在我们的结果与计算预测之间找到很强的定性一致性。因此,这项工作中提出的结果应有助于通知ZnO纳米线阵列的设计,以便总体上优化其场发射特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号