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Block-level test scheduling under power dissipation constraints

机译:功耗约束下的块级测试调度

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摘要

As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser memory ICs arc implemented for high-performancc digital systems, power dissipation becomes a critical factor and can no longer be ignored cither in normal operation of the system or under test conditions. One of the major considerations in test scheduling is the fact that heat dissipated during test application is significantly higher than during normal operation (sometimes 100 - 200% higher). Therefore, this is one of the recent major considerations in test scheduling. Test scheduling is strongly related to test concurrency. Test concurrency is a design property which strongly impacts testability and power dissipation. To satisfy high fault coverage goals with reduced test application time under certain power dissipation constraints, the testing of all components on the system should be performed m parallel to the greatest extent possible.ududSome theoretical analysis of this problem has been carried out, but only at IC level. The problem was basically described as a compatible test clustering, where the compatibility among tests was given by test resource and power dissipation conflicts at the same time. From an implementation point of view this problem was identified as an Non-Polynomial (NP) complete problem In this thesis, an efficient scheme for overlaying the block-tcsts, called the extended tree growing technique, is proposed together with classical scheduling algorithms to search for power-constrained blocktest scheduling (PTS) profiles m a polynomial time Classical algorithms like listbased scheduling and distribution-graph based scheduling arc employed to tackle at high level the PTS problem. This approach exploits test parallelism under power constraints. This is achieved by overlaying the block-tcst intervals of compatible subcircuits to test as many of them as possible concurrently so that the maximum accumulated power dissipation is balanced and does not exceed the given limit. The test scheduling discipline assumed here is the partitioned testing with run to completion. A constant additive model is employed for power dissipation analysis and estimation throughout the algorithm.
机译:随着诸如VLSI和多芯片模块(MCM)之类的dcvicc技术变得成熟,并且为高性能数字系统实现了更大,更密集的存储器IC,功耗已成为一个关键因素,在系统的正常运行或环境下,它不再被忽略。在测试条件下。测试计划中的主要考虑因素之一是,在测试应用过程中散发的热量明显高于正常运行过程中的热量(有时高出100-200%)。因此,这是测试计划中最近的主要考虑因素之一。测试计划与测试并发紧密相关。测试并发是一种设计属性,会严重影响可测试性和功耗。为了在某​​些功耗约束下以减少测试应用时间来满足较高的故障覆盖率目标,应尽可能最大程度地并行执行系统中所有组件的测试。 ud ud对此问题进行了一些理论分析,但仅在IC级别。该问题基本上被描述为兼容的测试群集,其中测试之间的兼容性由测试资源和功耗冲突同时给出。从实现的角度来看,该问题被确定为非多项式(NP)完全问题。本文提出了一种有效的覆盖块tcst的方案,称为扩展树生长技术,并结合经典的调度算法进行搜索。用于多项式时间的功率受限的块测试调度(PTS)配置文件经典算法(例如基于列表的调度和基于分布图的调度)可在更高级别解决PTS问题。这种方法利用功率约束下的测试并行性。这是通过重叠兼容子电路的block-tcst间隔以同时测试尽可能多的子电路来实现的,从而使最大累积功耗得到平衡,并且不会超过给定的限制。这里假设的测试计划原则是从运行到完成的分区测试。在整个算法中,采用常数累加模型进行功耗分析和估计。

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    Muresan Valentin;

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  • 年度 2002
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  • 正文语种 en
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