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White beam synchrotron x-ray topography and micro-raman spectroscopy characterization of crystal materials

机译：白光束同步辐射X射线形貌和微拉曼光谱表征晶体材料

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Chen Weimin;
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2. Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films [J] . Dudley M, Bai J, Huang X, Materials science in semiconductor processing . 2006,第1a3期

机译：同步带隙白光X射线形貌，透射电子显微镜和高分辨率X射线衍射研究宽带隙半导体晶体和薄膜中的缺陷和应变松弛过程
3. Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography [J] . D. Allen, J. Wittge, A. Zlotos, Nuclear instruments and methods in physics research . 2010,第3a4期

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4. CHARACTERIZATION OF DEFECT AND STRAIN CONFIGURATIONS IN LANGANITE AND LANGATATE SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY, AND ASSESSMENT OF THEIR INFLUENCE ON RESONATOR PERFORMANCE [C] . M. DUDLEY, B. RAGHOTHAMACHAR, H. CHEN, 14th European Frequency and Time Forum (EFTF), Mar 14-16, 2000, Torino (Italy) . 2000

机译：同步流变白束X射线断层照相法表征钙锰矿和镧系单晶的缺陷和应变构型及其对谐振器性能的影响
5. Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials. [D] . Sarkar, Vishwanath. 2011

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6. Synchrotron radiation: micrometer-sized x-ray beams as fine tools for macromolecular crystallography [O] . Thomas R. Schneider 2008

机译：同步辐射：微米级的X射线束作为高分子晶体学的优良工具
7. Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-raman spectroscopy and white beam x-ray topography [O] . Allen, David, Wittge, Jochen, Zlotos, A., 2010

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8. Synchrotron White Beam X-Ray Topography Characterization of LGX and SXGS Bulk Single Crystals, Thin Films and Piezoelectric Devices [R] . Dudley, M. 2007

机译：LGX和sXGs大块单晶，薄膜和压电器件的同步加速器白光束X射线形貌表征

White beam synchrotron x-ray topography and micro-raman spectroscopy characterization of crystal materials

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