Linear model-based testing of ADC nonlinearities

摘要

In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test.